R
Rodney S. Ruoff
Researcher at Ulsan National Institute of Science and Technology
Publications - 689
Citations - 214247
Rodney S. Ruoff is an academic researcher from Ulsan National Institute of Science and Technology. The author has contributed to research in topics: Graphene & Graphene oxide paper. The author has an hindex of 164, co-authored 666 publications receiving 194902 citations. Previous affiliations of Rodney S. Ruoff include Texas State University & North Carolina State University.
Papers
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Structurally driven one-dimensional electron confinement in sub-5-nm graphene nanowrinkles
TL;DR: The demonstration of one-dimensional electron confinement in graphene provides the novel possibility of controlling its electronic properties not by chemical modification but by ‘mechanical structuring'.
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Two‐Dimensional Materials for Beyond‐Lithium‐Ion Batteries
TL;DR: In this paper, the use of 2D materials in these future "beyond-lithium-ion" battery systems is reviewed, and strategies to address challenges are discussed as well as their prospects.
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Tuning the doping type and level of graphene with different gold configurations.
Yaping Wu,Wei Jiang,Yujie Ren,Weiwei Cai,Wi Hyoung Lee,Huifeng Li,Richard D. Piner,Cody W. Pope,Yufeng Hao,Hengxing Ji,Junyong Kang,Rodney S. Ruoff +11 more
TL;DR: Different doping properties of Au-graphene systems are induced by the chemical interactions between graphene and the different Au configurations (isolated nanoparticle and continuous film).
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Mesoscale Imperfections in MoS2 Atomic Layers Grown by a Vapor Transport Technique
TL;DR: The electrical imaging of dendritic ad-layers and grain boundaries in monolayer molybdenum disulfide (MoS2) grown by a vapor transport technique using microwave impedance microscopy shows ability to map the local electrical properties in a rapid and nondestructive manner.
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Mechanical measurements of ultra-thin amorphous carbon membranes using scanning atomic force microscopy
TL;DR: In this paper, the elastic modulus of amorphous carbon films was investigated by integrating atomic force microscopy (AFM) imaging in contact mode with finite element analysis (FEA), and the deformation of these ultra-thin membranes was measured by recording topography images at different normal loads using contact mode AFM.