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S. P. Kowalczyk

Researcher at Electronics Research Center

Publications -  10
Citations -  1221

S. P. Kowalczyk is an academic researcher from Electronics Research Center. The author has contributed to research in topics: Heterojunction & X-ray photoelectron spectroscopy. The author has an hindex of 6, co-authored 10 publications receiving 1054 citations.

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Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

TL;DR: In this article, a method for locating the valence-band edge in x-ray photo-emission spectra is reported. But this method is not suitable for measuring semiconductor interface potentials.
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Measurement of potential at semiconductor interfaces by electron spectroscopy

TL;DR: In this article, the authors discuss some of the factors which affect applications of Auger electron spectroscopy, ultraviolet photoelectron spectrographs, soft x-ray photoelectram spectrograms, and x-rays photoelectromagnetes for semiconductor interface potential measurements.
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Heterojunction band discontinuity growth sequence variation at compound semiconductor‐germanium (110) interfaces: Possible role of antiphase disorder

TL;DR: In this paper, the authors studied the valence-band discontinuity at heterojunctions formed by growing GaAs epitaxially on Ge(110) substrates and observed that the GaAs grown on Ge (110) interface exhibit a time dependent variation in ΔEv that is as much as ∼ 0.2 eV.
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Photochemical deposition of Sn for use in molecular beam epitaxy of GaAs

TL;DR: In this paper, the suitability of several Sn-containing molecules (tetramethyltin, tetrabutyltin and stannic chloride) as gas phase sources of Sn for use in molecular beam epitaxy of GaAs was evaluated.