S
S. Venkatachalam
Researcher at Bharathiar University
Publications - 21
Citations - 657
S. Venkatachalam is an academic researcher from Bharathiar University. The author has contributed to research in topics: Vacuum evaporation & Thin film. The author has an hindex of 15, co-authored 20 publications receiving 606 citations. Previous affiliations of S. Venkatachalam include University of Yamanashi.
Papers
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Journal ArticleDOI
Bacterial adhesion studies on titanium, titanium nitride and modified hydroxyapatite thin films
Y. L. Jeyachandran,S. Venkatachalam,B. Karunagaran,Sa. K. Narayandass,D. Mangalaraj,Chongyun Bao,Chao-Liang Zhang +6 more
TL;DR: A qualitative study on adhesion of the oral bacteria Porphyromonas gingivalis on titanium (Ti), titanium nitride (TiN), fluorine modified hydroxyapatite (FHA), and zinc modified FHA (Zn-FHA) thin films is investigated in this paper.
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Structure, optical and electrical properties of ZnSe thin films
TL;DR: The influence of substrate temperature on compositional, structural, optical and electrical properties of polycrystalline ZnSe films was investigated using Rutherford backscattering spectrometry (RBS), X-ray diffraction (XRD), Scanning electron microscopy (SEM), optical transmission and DC conduction studies as discussed by the authors.
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Characterization of vacuum-evaporated ZnSe thin films
S. Venkatachalam,Y. L. Jeyachandran,P. Sureshkumar,A. Dhayalraj,D. Mangalaraj,Sa. K. Narayandass,S. Velumani +6 more
TL;DR: In this article, the composition, structure, optical and electrical properties of the deposited ZnSe thin films were studied using the energy dispersive X-ray analysis (EDAX), Xray diffraction (XRD), optical transmittance and current voltage measurements.
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Characterization of vacuum-evaporated ZnSe thin films
TL;DR: In this article, ZnSe thin films were deposited onto glass substrates under a vacuum of 3×10 −5 ǫ Torr by using vacuum evaporation technique.
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Microstructure, Raman and optical studies on Cd0.6Zn0.4Te thin films
TL;DR: In this paper, structural, Raman and optical properties of Cd0.6Zn0.4Te polycrystalline thin films deposited onto well cleaned corning glass substrates by vacuum evaporation were investigated.