S
S. Venkataraman
Researcher at University of Illinois at Urbana–Champaign
Publications - 1
Citations - 439
S. Venkataraman is an academic researcher from University of Illinois at Urbana–Champaign. The author has contributed to research in topics: Fault coverage & Test data. The author has an hindex of 1, co-authored 1 publications receiving 426 citations.
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Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
TL;DR: A new scheme for built-in test that uses multiple-polynomial linear feedback shift registers (MP-LFSR's) and an implicit polynomial identification reduces the number of extra bits per seed to one bit is presented.