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Samuel Graham

Researcher at Georgia Institute of Technology

Publications -  361
Citations -  12423

Samuel Graham is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Thermal conductivity & Thin film. The author has an hindex of 48, co-authored 347 publications receiving 9774 citations. Previous affiliations of Samuel Graham include Merck & Co. & United States Military Academy.

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Engineering the Mechanical Properties of Ultrabarrier Films Grown by Atomic Layer Deposition for the Encapsulation of Printed Electronics

TL;DR: In this paper, the performance of aluminum oxide (Al2O3)/hafnium oxide (HfO2) nanolaminate barrier films was evaluated on a fluorinated polymer layer using an optical calcium (Ca) test under damp heat.
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Development of highly flexible and ultra-low permeation rate thin-film barrier structure for organic electronics

TL;DR: A flexible thin-film encapsulation architecture for organic electronics was built and consisted of a silicon oxide/alumina and parylene layer deposited over Ca sensors on a barrier-coated polyethylene terephthalate substrate as discussed by the authors.
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Experimental observation of high intrinsic thermal conductivity of AlN

TL;DR: In this article, the authors reported the growth of thick (g15 \ensuremath{mu}m) AlN layers by metal-organic chemical vapor deposition and experimental observation of intrinsic thermal conductivity from 130 to 480 K that matches density-functional-theory calculations for single crystal AlN, producing some of the highest values ever measured.
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Stress relaxation in GaN by transfer bonding on Si substrates

TL;DR: In this paper, the stress state of GaN epilayers transferred onto Si substrates through a Au-Si bonding process was studied by micro-Raman scattering and photoluminescence techniques.