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Samuel Graham

Bio: Samuel Graham is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Thermal conductivity & Thermal resistance. The author has an hindex of 48, co-authored 347 publications receiving 9774 citations. Previous affiliations of Samuel Graham include Merck & Co. & United States Military Academy.


Papers
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TL;DR: Using time-domain thermoreflectance along with electron energy loss spectroscopy, it is determined that a SiN interfacial layer provided the lowest thermal boundary resistance (<10 m2K/GW) because of the formation of an Si-C-N layer at the interface.
Abstract: The development of GaN-on-diamond devices holds much promise for the creation of high-power density electronics. Inherent to the growth of these devices, a dielectric layer is placed between the GaN and diamond, which can contribute significantly to the overall thermal resistance of the structure. In this work, we explore the role of different interfaces in contributing to the thermal resistance of the interface of GaN/diamond layers, specifically using 5 nm layers of AlN, SiN, or no interlayer at all. Using time-domain thermoreflectance along with electron energy loss spectroscopy, we were able to determine that a SiN interfacial layer provided the lowest thermal boundary resistance (<10 m2K/GW) because of the formation of an Si–C–N layer at the interface. The AlN and no interlayer samples were observed to have TBRs greater than 20 m2K/GW as a result of a harsh growth environment that roughened the interface (enhancing phonon scattering) when the GaN was not properly protected.

88 citations

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TL;DR: In this article, an analytical method is presented to estimate the effects of structural disorder on the thermal boundary conductance (TBC) between two materials, where the interface is modeled as a virtual crystal of finite thickness with properties derived from those of the constituent materials.
Abstract: An analytical method is presented to estimate the effects of structural disorder on the thermal boundary conductance (TBC) between two materials. The current method is an extension of the diffuse mismatch model (DMM) where the interface is modeled as a virtual crystal of finite thickness with properties derived from those of the constituent materials. Using this approximation, the TBC for a series of chromium/silicon interfaces is modeled and shown to be within 18% of experimentally obtained values. The methodology improves upon the predictive capabilities of the DMM and allows for quick estimation of the impact of interface mixing on TBC.

87 citations

Journal ArticleDOI
TL;DR: In this article, the authors studied the thermal transport across the interfaces of Ga2O3 exfoliated onto a single crystal diamond and found that the van der Waals bonded temperature was 17 −1.7/+2.0 MW/m2 K, which is comparable to the TBC of several physical-vapor-deposited metals on diamond.
Abstract: Because of its ultra-wide bandgap, high breakdown electric field, and large-area affordable substrates grown from the melt, β-Ga2O3 has attracted great attention recently for potential applications of power electronics. However, its thermal conductivity is significantly lower than those of other wide bandgap semiconductors, such as AlN, SiC, GaN, and diamond. To ensure reliable operation with minimal self-heating at high power, proper thermal management is even more essential for Ga2O3 devices. Similar to the past approaches aiming to alleviate self-heating in GaN high electron mobility transistors, a possible solution has been to integrate thin Ga2O3 membranes with diamond to fabricate Ga2O3-on-diamond lateral metal-semiconductor field-effect transistor or metal-oxide-semiconductor field-effect transistor devices by taking advantage of the ultra-high thermal conductivity of diamond. Even though the thermal boundary conductance (TBC) between wide bandgap semiconductor devices and a diamond substrate is of primary importance for heat dissipation in these devices, fundamental understanding of the Ga2O3-diamond thermal interface is still missing. In this work, we study the thermal transport across the interfaces of Ga2O3 exfoliated onto a single crystal diamond. The van der Waals bonded Ga2O3-diamond TBC is measured to be 17 −1.7/+2.0 MW/m2 K, which is comparable to the TBC of several physical-vapor-deposited metals on diamond. A Landauer approach is used to help understand phonon transport across a perfect Ga2O3-diamond interface, which in turn sheds light on the possible TBC one could achieve with an optimized interface. A reduced thermal conductivity of the Ga2O3 nano-membrane is also observed due to additional phonon-membrane boundary scattering. The impact of the Ga2O3–substrate TBC and substrate thermal conductivity on the thermal performance of a power device is modeled and discussed. Without loss of generality, this study is not only important for Ga2O3 power electronics applications which would not be realistic without a thermal management solution but also for the fundamental thermal science of heat transport across van der Waals bonded interfaces.

85 citations

Journal ArticleDOI
TL;DR: In this article, a comparative analysis of the residual stress distributions across the conductive channel of Ga-face AlGaN/GaN high electron mobility transistors (HEMTs) is presented.
Abstract: A comparative analysis of the residual stress distributions across the conductive channel of Ga-face AlGaN/GaN high electron mobility transistors (HEMTs) is presented. Stress was measured by means of micro-Raman spectroscopy and micro-photoluminescence (PL). Raman measurements probed the volume average of the stress through the GaN layer whereas the stress near the GaN surface (AlGaN/GaN heterointerface) was acquired via PL. By combining Raman, PL, and x-ray diffraction, a self-consistent method was developed to accurately determine the variation in magnitude of stress throughout the thickness of the GaN layer. Based on this framework, it is observed in AlGaN/GaN HEMTs that a depth variation in the GaN residual stress occurs near the gate and ohmic electrodes. At these regions, the stress near the AlGaN/GaN interface (or GaN surface) exhibits a tensile shift compared to the stress averaged through the entire thickness of GaN. Across the conductive channel (away from the metal pads), the bulk average stress and the stress near this interface remain nearly identical, showing little evidence of a vertical gradient. It is expected that the induced tensile strain at the drain side gate edge will have an impact on device reliability by contributing to the elastic energy built in the AlGaN barrier in addition to the inverse piezoelectric contribution at operating conditions, which may lead to formation of crystallographic defects.

84 citations

Journal ArticleDOI
TL;DR: A series of harmonic Joule-heating experiments have been employed to determine the thermal conductivities of thin films of pentacene, N,N′-diphenyl−N,N, N′-di(3-methylphenyl)−(1,1′-biphenylon)-4,4′-dimine, and tris(8-hydroquinolinato)aluminum, three widely used organic semiconductors.
Abstract: A series of harmonic Joule-heating experiments have been employed to determine the thermal conductivities of thin films of pentacene, N,N′-diphenyl−N,N′-di(3-methylphenyl)−(1,1′-biphenyl)-4,4′-diamine, and tris(8-hydroquinolinato)aluminum, three widely used organic semiconductors Room-temperature thermal conductivity values of 051, 024, and 048W∕mK were measured for films of these three compounds, respectively These values are over two orders of magnitude lower than those of inorganic semiconductors While amorphous films were found to display only small thermal conductivity changes over the temperature range of 228–350 K, pentacene exhibited stronger variations that are typical of phonon-phonon scattering observed in polycrystalline semiconductors

81 citations


Cited by
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[...]

08 Dec 2001-BMJ
TL;DR: There is, I think, something ethereal about i —the square root of minus one, which seems an odd beast at that time—an intruder hovering on the edge of reality.
Abstract: There is, I think, something ethereal about i —the square root of minus one. I remember first hearing about it at school. It seemed an odd beast at that time—an intruder hovering on the edge of reality. Usually familiarity dulls this sense of the bizarre, but in the case of i it was the reverse: over the years the sense of its surreal nature intensified. It seemed that it was impossible to write mathematics that described the real world in …

33,785 citations

01 May 1993
TL;DR: Comparing the results to the fastest reported vectorized Cray Y-MP and C90 algorithm shows that the current generation of parallel machines is competitive with conventional vector supercomputers even for small problems.
Abstract: Three parallel algorithms for classical molecular dynamics are presented. The first assigns each processor a fixed subset of atoms; the second assigns each a fixed subset of inter-atomic forces to compute; the third assigns each a fixed spatial region. The algorithms are suitable for molecular dynamics models which can be difficult to parallelize efficiently—those with short-range forces where the neighbors of each atom change rapidly. They can be implemented on any distributed-memory parallel machine which allows for message-passing of data between independently executing processors. The algorithms are tested on a standard Lennard-Jones benchmark problem for system sizes ranging from 500 to 100,000,000 atoms on several parallel supercomputers--the nCUBE 2, Intel iPSC/860 and Paragon, and Cray T3D. Comparing the results to the fastest reported vectorized Cray Y-MP and C90 algorithm shows that the current generation of parallel machines is competitive with conventional vector supercomputers even for small problems. For large problems, the spatial algorithm achieves parallel efficiencies of 90% and a 1840-node Intel Paragon performs up to 165 faster than a single Cray C9O processor. Trade-offs between the three algorithms and guidelines for adapting them to more complex molecular dynamics simulations are also discussed.

29,323 citations

Journal ArticleDOI
01 Aug 2014-Science
TL;DR: Perovskite films received a boost in photovoltaic efficiency through controlled formation of charge-generating films and improved current transfer to the electrodes and low-temperature processing steps allowed the use of materials that draw current out of the perovskites layer more efficiently.
Abstract: Advancing perovskite solar cell technologies toward their theoretical power conversion efficiency (PCE) requires delicate control over the carrier dynamics throughout the entire device. By controlling the formation of the perovskite layer and careful choices of other materials, we suppressed carrier recombination in the absorber, facilitated carrier injection into the carrier transport layers, and maintained good carrier extraction at the electrodes. When measured via reverse bias scan, cell PCE is typically boosted to 16.6% on average, with the highest efficiency of ~19.3% in a planar geometry without antireflective coating. The fabrication of our perovskite solar cells was conducted in air and from solution at low temperatures, which should simplify manufacturing of large-area perovskite devices that are inexpensive and perform at high levels.

5,789 citations

Journal ArticleDOI
TL;DR: A novel non-fullerene electron acceptor (ITIC) that overcomes some of the shortcomings of fullerene acceptors, for example, weak absorption in the visible spectral region and limited energy-level variability, is designed and synthesized.
Abstract: A novel non-fullerene electron acceptor (ITIC) that overcomes some of the shortcomings of fullerene acceptors, for example, weak absorption in the visible spectral region and limited energy-level variability, is designed and synthesized. Fullerene-free polymer solar cells (PSCs) based on the ITIC acceptor are demonstrated to exhibit power conversion effi ciencies of up to 6.8%, a record for fullerene-free PSCs.

3,048 citations