S
Sandeep Kumar Goel
Researcher at TSMC
Publications - 122
Citations - 2454
Sandeep Kumar Goel is an academic researcher from TSMC. The author has contributed to research in topics: Automatic test pattern generation & Interposer. The author has an hindex of 28, co-authored 117 publications receiving 2385 citations. Previous affiliations of Sandeep Kumar Goel include Digital Designs & Duke University.
Papers
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Proceedings ArticleDOI
Wrapper design for embedded core test
TL;DR: It is shown that the ordering and partitioning of wrapper cells and core-internal scan chains over TAM chains determine the test time of the core, and an heuristic approach for the NP-hard problem of partitioning the TAM chain items for minimal test time is presented.
Proceedings ArticleDOI
Effective and efficient test architecture design for SOCs
TL;DR: A novel architecture-independent heuristic algorithm is presented that effectively optimizes the test architecture for a given SOC and can be used for optimizing both test bus and testrail architectures with serial and parallel test schedules.
Journal ArticleDOI
Design for debug: catching design errors in digital chips
TL;DR: The system presented here consists of an on-chip debug infrastructure and supporting debugger software, which interacts with the infrastructure to make the chip's features accessible through a serial interface.
Proceedings ArticleDOI
Core-based scan architecture for silicon debug
TL;DR: The reasons behind the core-based debug architecture, together with implementation details, are described and the results of an area-cost evaluation of the presented architecture for these two large Philips system chips are presented.
Journal ArticleDOI
SOC test architecture design for efficient utilization of test bandwidth
TL;DR: This article formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given, and derive a formulation for an architecture-independent lower bound for the SOC test time.