scispace - formally typeset
S

Saravanapriyan Sriraman

Researcher at Lam Research

Publications -  46
Citations -  1568

Saravanapriyan Sriraman is an academic researcher from Lam Research. The author has contributed to research in topics: Silicon & Etching (microfabrication). The author has an hindex of 16, co-authored 46 publications receiving 1385 citations. Previous affiliations of Saravanapriyan Sriraman include Princeton University & University of California, Santa Barbara.

Papers
More filters
Journal ArticleDOI

Overview of atomic layer etching in the semiconductor industry

TL;DR: Atomic layer etching (ALE) is a technique for removing thin layers of material using sequential reaction steps that are self-limiting as mentioned in this paper, which has been studied in the laboratory for more than 25 years.
Journal ArticleDOI

Mechanism of hydrogen-induced crystallization of amorphous silicon

TL;DR: The mechanism of hydrogen-induced crystallization of hydrogenated amorphous silicon films during post-deposition treatment with an H2 (or D2) plasma is reported, which is mediated by the insertion of H atoms into strained Si–Si bonds as the atoms diffuse through the film.
Journal ArticleDOI

Coarse Master Equation from Bayesian Analysis of Replica Molecular Dynamics Simulations

TL;DR: It is shown that accurate thermodynamic and kinetic properties, such as free energy surfaces and kinetic rate coefficients, can be computed from coarse master equations obtained through Bayesian inference.
Patent

Multi-step method for etching strain gate recesses

TL;DR: In this paper, a plasma-enhanced etch-deposit-etch sequence was proposed to perform controllable lateral etches into the silicon layer using a plasmaenhanced enabler.
Journal ArticleDOI

Coarse nonlinear dynamics and metastability of filling-emptying transitions: water in carbon nanotubes.

TL;DR: Using a coarse-grained molecular dynamics (CMD) approach, the apparent nonlinear dynamics of water molecules filling or emptying carbon nanotubes as a function of system parameters are studied.