scispace - formally typeset
S

Scott Davidson

Researcher at Sun Microsystems

Publications -  29
Citations -  419

Scott Davidson is an academic researcher from Sun Microsystems. The author has contributed to research in topics: Automatic test pattern generation & Design for testing. The author has an hindex of 8, co-authored 26 publications receiving 401 citations.

Papers
More filters
Journal ArticleDOI

Losing control

TL;DR: This column looks back at the days when the authors had direct, tactile control of their appliances and wonders what impact the loss of this control is having on their children's interest in engineering.
Proceedings ArticleDOI

ITC'99 Benchmark Circuits - Preliminary Results

TL;DR: The goal of this benchmarking effort is to test new DFT techniques on real designs, using the DAT test generation system and two sequential test generators developed at the University of Iowa.
Journal ArticleDOI

Open-source hardware

TL;DR: This presentation explains why it is important to select an open-source operating system, browser, and office productivity package for your home or office, and explains how to choose the right one for your needs.
Journal Article

Twenty Years Ago Today

Patent

Reducing verification time for integrated circuit design including scan circuits

TL;DR: In this article, a testbench for an integrated circuit (IC) design including a chain of scan circuits having a memory characteristic is verified by dividing the chain and creating a plurality of partitions, each partition including at least one logic cone output.