scispace - formally typeset
Search or ask a question

Showing papers by "Sheldon Schultz published in 1992"


Journal ArticleDOI
TL;DR: In this paper, a technique for using a magnetic force microscope (MFM) as a local field source for mapping the sensitivity function of magnetic recording heads is described, and the results obtained from applying this technique to both magnetoresistive and inductive recording heads are discussed.
Abstract: A technique for using a magnetic force microscope (MFM) as a local field source for mapping the sensitivity function of magnetic recording heads is described. The results obtained from applying this technique to both magnetoresistive and inductive recording heads are discussed. >

28 citations


Proceedings ArticleDOI
01 May 1992
TL;DR: Schultz et al. as discussed by the authors developed a magneto-optic Kerr scanned near-field optical microscope with 10 nm resolution, which can observe magnetization distributions with sub-wavelength resolution.
Abstract: Development toward magneto-optic Kerr scanned near-field optical microscope with 10 nm resolutionS. Schultz and T. J. SilvaUniversity of California, San Diego, Department of Physics 03199500 Gilman Dr., La Jolla, CA 92093-03 19ABSTRACTWork is described on the development of a £canned Near-field Qptical Microscope (SNOM) to observemagnetization distributions with sub-wavelength resolution. Contrast is provided by the magneto-opticKerr effect. A single Ag particle of -30 nm diameter was chosen as a SNOM probe for reasons unique to

5 citations


Proceedings ArticleDOI
01 May 1992
TL;DR: In this article, a high resolution, high sensitivity magnetic force microscope (MFM) with the ability to image in an in situ magnetic field is described, which allows the study of the evolution of the particles' magnetic states as a function of applied field and direct observation of cooperative switching.
Abstract: A high resolution, high sensitivity magnetic force microscope (MFM) with the ability to image in an in situ magnetic field will be described. This MFM has been used to investigate the micromagnetics of nanolithographically produced magnetic particles. It will be shown that the particles' switching field can be determined without being perturbed by the stray fields from the sensing tip. This allows the study of the evolution of the particles' magnetic states as a function of applied field and the direct observation of cooperative switching. The MFM has also been used, in conjunction with an external biasing field, as a localized source of flux for testing the stability of magnetic states and setting model magnetic configurations. MFM images of the particles are compared with numerical simulations. These comparisons have also provided insight into the magnetic behavior of the MFM sensing tips.© (1992) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.