S
Shen Yin
Researcher at Harbin Institute of Technology
Publications - 260
Citations - 16776
Shen Yin is an academic researcher from Harbin Institute of Technology. The author has contributed to research in topics: Fault detection and isolation & Nonlinear system. The author has an hindex of 56, co-authored 226 publications receiving 13092 citations. Previous affiliations of Shen Yin include China Academy of Engineering Physics & University of Duisburg-Essen.
Papers
More filters
Journal ArticleDOI
A Review on Basic Data-Driven Approaches for Industrial Process Monitoring
TL;DR: A basic data-driven design framework with necessary modifications under various industrial operating conditions is sketched, aiming to offer a reference for industrial process monitoring on large-scale industrial processes.
Journal ArticleDOI
A comparison study of basic data-driven fault diagnosis and process monitoring methods on the benchmark Tennessee Eastman process
TL;DR: A comparison study on the basic data-driven methods for process monitoring and fault diagnosis (PM–FD) based on the original ideas, implementation conditions, off-line design and on-line computation algorithms as well as computation complexity are discussed in detail.
Journal ArticleDOI
Data-Based Techniques Focused on Modern Industry: An Overview
TL;DR: The main objective of this paper is to review and summarize the recent achievements in data-based techniques, especially for complicated industrial applications, thus providing a referee for further study on the related topics both from academic and practical points of view.
Journal ArticleDOI
Real-Time Implementation of Fault-Tolerant Control Systems With Performance Optimization
Shen Yin,Hao Luo,Steven X. Ding +2 more
TL;DR: Two online schemes for an integrated design of fault-tolerant control (FTC) systems with application to Tennessee Eastman (TE) benchmark are proposed.
Journal ArticleDOI
Improved PLS Focused on Key-Performance-Indicator-Related Fault Diagnosis
TL;DR: An improved PLS (IPLS) approach is presented, able to decompose the measurable process variables into the KPI-related and unrelated parts, respectively, and shows satisfactory results not only for diagnosing K PI-related faults but also for its high fault detection rate.