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Sheng-Yao Huang

Researcher at National Sun Yat-sen University

Publications -  17
Citations -  763

Sheng-Yao Huang is an academic researcher from National Sun Yat-sen University. The author has contributed to research in topics: Resistive random-access memory & Amorphous solid. The author has an hindex of 12, co-authored 17 publications receiving 715 citations.

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Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films

TL;DR: In this article, the influence of electrode material on resistance switching is investigated through Pt/InGaZnO/TiN devices, which perform the unipolar and bipolar behavior as applying bias on Pt and TiN electrode, respectively.
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Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

TL;DR: In this article, the degradation mechanism of amorphous indium-gallium-zinc oxide thin-film transistors under gate-bias stress was investigated and it was shown that an extra electron trapping mechanism occurs during rising/falling time during the AC pulse period.
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Bipolar Resistive Switching Characteristics of Transparent Indium Gallium Zinc Oxide Resistive Random Access Memory

TL;DR: In this paper, a sputtered InGaZnO (IGZO) thin film was applied into a resistive random access memory (RAM) device, which exhibited a repeatable bipolar resistance switching behavior without an electroforming process.
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A low-temperature method for improving the performance of sputter-deposited ZnO thin-film transistors with supercritical fluid

TL;DR: In this article, a low-temperature method, supercritical CO2 (SCCO2) fluid technology, was employed to improve the device properties of ZnO TFT at 150 °C.
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Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

TL;DR: In this paper, the effects of ambient atmosphere on electrical characteristics of Al2O3 passivated InGaZnO thin film transistors during positive bias temperature stress were investigated.