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Shuit-Tong Lee

Researcher at Soochow University (Suzhou)

Publications -  1129
Citations -  84313

Shuit-Tong Lee is an academic researcher from Soochow University (Suzhou). The author has contributed to research in topics: Silicon & Nanowire. The author has an hindex of 138, co-authored 1121 publications receiving 77112 citations. Previous affiliations of Shuit-Tong Lee include University of British Columbia & Hong Kong University of Science and Technology.

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Non-reflective black cathode in organic light-emitting diode

TL;DR: A black conductive electrode with a resistivity of 6.75×10−4 Ω cm was fabricated by doping silicon monoxide into aluminum by simple thermal evaporation.
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Scanning tunneling microscope excited cathodoluminescence from ZnS nanowires.

TL;DR: The electronic excitation spectrum of ZnS nanowires (NWs) is characterized by cathodoluminescence (CL) excited using the tip of a scanning tunneling microscope as a highly localized and bright source of low-energy electrons with impinging power densities in the range of up to 60 kW/cm(2) or more.
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Fabrication of Architectures with Dual Hollow Structures: Arrays of Cu2O Nanotubes Organized by Hollow Nanospheres

TL;DR: In this paper, a new strategy was proposed to study the diffusion rate relationship between diffusion co-occurrence and ascorbic acid molecules during the reaction process, in which the successful design and synthesis of arrays of CU2O/Cu2−xSe heterogeneous nanotubes constructed from Cu2O hollow seminanospheres covered on both the inner and the outer surfaces of Cu2+xSe sheaths with a thickness about 5−10 nm.
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Heteroepitaxial nucleation of diamond on Si(100) via double bias-assisted hot filament chemical vapor deposition

TL;DR: In this article, a double bias-assisted hot filament chemical vapor deposition (HFCVD) was used to obtain high density epitaxial diamond nucleation via a double-biased HFCVD.
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Different copper oxide nanostructures: Synthesis, characterization, and application for C-N cross-coupling catalysis

TL;DR: In this article, structural and morphological characterizations of these copper oxide micro-/nanomaterials were performed by X-ray powder diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscope (TEM).