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Simo Huotari

Researcher at University of Helsinki

Publications -  179
Citations -  3985

Simo Huotari is an academic researcher from University of Helsinki. The author has contributed to research in topics: Scattering & Inelastic scattering. The author has an hindex of 32, co-authored 167 publications receiving 3404 citations. Previous affiliations of Simo Huotari include Pierre-and-Marie-Curie University & European Synchrotron Radiation Facility.

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Mass‐Production of Mesoporous MnCo2O4 Spinels with Manganese(IV)‐ and Cobalt(II)‐Rich Surfaces for Superior Bifunctional Oxygen Electrocatalysis

TL;DR: The prominent bifunctional activity shows that MnCo2 O4 could be used in metal-air batteries and/or other energy devices and the surface state engineering may open a new avenue to optimize the electrocatalysis performance of electrode materials.
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Microscopic structure of water at elevated pressures and temperatures

TL;DR: According to the simulations, distortions of the hydrogen-bond network increase dramatically when temperature and pressure increase to the supercritical regime and the average number of hydrogen bonds per molecule decreases.
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Multiple-element spectrometer for non-resonant inelastic X-ray spectroscopy of electronic excitations

TL;DR: A multiple-analyser-crystal spectrometer for non-resonant inelastic X-ray scattering spectroscopy installed at beamline ID16 of the European Synchrotron Radiation Facility is presented.
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Direct tomography with chemical-bond contrast

TL;DR: This work introduces a new hard-X-ray spectroscopic tomography with a unique sensitivity to light elements, and applies the method to acquire the 3D structure and map the chemical bonding in selected samples relevant to materials science.
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Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors.

TL;DR: A dispersion-compensation method to remove the cube-size effect from the resolution function of diced analyzer crystals using a position-sensitive two-dimensional pixel detector is presented, allowing a substantial increase in the resolving power without any loss of signal intensity.