S
Sokrates T. Pantelides
Researcher at Vanderbilt University
Publications - 833
Citations - 43326
Sokrates T. Pantelides is an academic researcher from Vanderbilt University. The author has contributed to research in topics: Scanning transmission electron microscopy & Graphene. The author has an hindex of 94, co-authored 806 publications receiving 37427 citations. Previous affiliations of Sokrates T. Pantelides include Drexel University & Lund University.
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Journal ArticleDOI
Vertical and in-plane heterostructures from WS2/MoS2 monolayers.
Yongji Gong,Junhao Lin,Xingli Wang,Gang Shi,Sidong Lei,Zhong Lin,Xiaolong Zou,Gonglan Ye,Robert Vajtai,Boris I. Yakobson,Humberto Terrones,Mauricio Terrones,Beng Kang Tay,Jun Lou,Sokrates T. Pantelides,Zheng Liu,Wu Zhou,Pulickel M. Ajayan +17 more
TL;DR: A one-step growth strategy for the creation of high-quality vertically stacked as well as in-plane interconnected heterostructures of WS2/MoS2 via control of the growth temperature is reported.
Journal ArticleDOI
Bandgap engineering of strained monolayer and bilayer MoS2.
Hiram Conley,Bin Wang,Bin Wang,Jed I. Ziegler,Jed I. Ziegler,Richard F. Haglund,Richard F. Haglund,Sokrates T. Pantelides,Sokrates T. Pantelides,Kirill I. Bolotin,Kirill I. Bolotin +10 more
TL;DR: A demonstration of strain engineering the band structure in the emergent class of two-dimensional crystals, transition-metal dichalcogenides, with pronounced strain-induced decrease in the photoluminescence intensity of monolayer MoS2 that is indicative of the direct-to-indirect transition of the character of the optical band gap.
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Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
Ondrej L. Krivanek,Matthew F. Chisholm,Valeria Nicolosi,Timothy J. Pennycook,Timothy J. Pennycook,G.J. Corbin,Niklas Dellby,M.F. Murfitt,Christopher S. Own,Z.S. Szilagyi,Mark P. Oxley,Mark P. Oxley,Sokrates T. Pantelides,Sokrates T. Pantelides,Stephen J. Pennycook,Stephen J. Pennycook +15 more
TL;DR: Annular dark-field imaging in an aberration-corrected scanning transmission electron microscope optimized for low voltage operation can resolve and identify the chemical type of every atom in monolayer hexagonal boron nitride that contains substitutional defects.
Journal ArticleDOI
Defects Engineered Monolayer MoS2 for Improved Hydrogen Evolution Reaction.
Gonglan Ye,Yongji Gong,Junhao Lin,Bo Li,Yongmin He,Sokrates T. Pantelides,Sokrates T. Pantelides,Wu Zhou,Robert Vajtai,Pulickel M. Ajayan +9 more
TL;DR: This work demonstrates that oxygen plasma exposure and hydrogen treatment on pristine monolayer MoS2 could introduce more active sites via the formation of defects within the monolayers, leading to a high density of exposed edges and a significant improvement of the hydrogen evolution activity.
Journal ArticleDOI
First-Principles Calculation of Transport Properties of a Molecular Device
TL;DR: First-principles calculations of the current-voltage characteristics of a molecular device are reported and show that the shape of the I-V curve is largely determined by the electronic structure of the molecule, while the presence of single atoms at the molecule-electrode interface play a key role in determining the absolute value of theCurrent.