Somasundaram Umapathy

Bio: Somasundaram Umapathy is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Speckle pattern & Holography. The author has an hindex of 1, co-authored 1 publications receiving 6 citations.

Use of two wavelengths in microscopic TV holography for nondestructive testing

Abstract: Single wavelength TV holography is a widely used whole-field noncontacting optical method for nondestructive testing (NDT) of engineering structures. However, with a single wavelength configuration, it is difficult to quantify the large amplitude defects due to the overcrowding of fringes in the defect location. In this work, we propose a two wavelength microscopic TV holography using a single-chip color charge-coupled device (CCD) camera for NDT of microspecimens. The use of a color CCD allows simultaneous acquisition of speckle patterns at two different wavelengths and makes the data acquisition as simple as that of the single wavelength case. For the quantitative measurement of the defect, an error compensating eight-step phase-shifted algorithm is used. The design of the system and a few experimental results on small-scale rough specimens are presented.

Accurate full-edge detection and depth measurement of internal defects using digital speckle pattern interferometry

Abstract: In this paper, a new method, Moment-Stiffness Method (MSM), is proposed for measuring the edge and depth of internal defects which can be applied to any structures with known stiffness. MSM is based on the relation of the differences of displacements between flawed and flawless areas caused by the change of stiffness. Theoretical, numerical and experimental results are presented. In the method, digital speckle pattern interferometry (DSPI) is used to measure the out-of-plane displacement of a plate with an internal defect. In the detection of the first specimen, the distributions of first- and second-order radial derivatives of the out-of-plane displacement are obtained by the radial numerical differential. Then the full edge and depth of the defect is accurately determined using MSM. All the results indicate that the proposed method is an effective tool to measure internal defects precisely.

Applications of higher-order phase shifting algorithms for multiple-wavelength metrology

Abstract: Multiple-wavelength interferometric techniques have been successfully used for large step-height and large deformation measurements. Also it could resolve the step height between smooth and rough surfaces which is not possible with single wavelength interferometry. Temporal phase shifting algorithm, which requires a phase shifter such as PZT, has been widely used for accurate phase evolution in interferometry. The phase shifter needs to be calibrated at every wavelength if multiple wavelengths are used for measurement, it is a time consuming process. If phase shifter is not calibrated accurately, it can introduce phase shift errors. In this work, we will discuss various phase shifting algorithms, and their tolerance for phase shift error. And the applications of higher-order phased shifting algorithms will be presented. The study is useful for multiple-wavelength and white light interferometry where more than one wavelength is used for optical phase measurements.

Multiple wavelength fringe analysis for surface profile measurements

Abstract: Interferometry has been widely used for surface metrology because of their precision, reliability, and versatility. Although monochromatic-light interferometery can provide high sensitivity and resolution, but it fails to quantify largediscontinuities. Multiple-wavelength techniques have been successfully used to extend the unambiguous step height measurement rage of single wavelength interferometer. The use of RGB CCD camera allows simultaneous acquisition of fringes generated at different wavelengths. In this work, we discuss details about the fringe analysis of white light interferograms acquired using colour CCD camera. The colour image acquired using RGB camera is decomposed in to red, green, blue components and corresponding interference phase is measured using phase evaluation algorithms. The approach makes the 3D surface measurements faster, cost-effective for industrial applications.

RGB speckle pattern interferometry for surface metrology

Abstract: Digital speckle pattern interferometry (DSPI) has been widely used for surface metrology of optically rough surfaces. Single visible wavelength can provide high measurement accuracy, but it limits the deformation measurement range of the interferometer. Also, it is difficult to reveal the shape of a rough surface with one wavelength in normal illumination and observation geometry. Using more than one visible wavelength in DSPI, one can measure large deformations as well as shape using synthetic wavelength approach. In this work, we will discuss multi-wavelength speckle pattern interferometry using a Bayer RGB sensor. The colour sensor allows simultaneous acquisition of speckle patterns at different wavelengths. The colour images acquired using RGB sensor is split in to its individual components and corresponding interference phase map is recovered using error compensating phase shifting algorithm. The wrapped phase is unwrapped to quantify the deformation or shape information of the sample under inspection. Theoretical background of RGB interferometry for deformation and shape measurements, and experimental results will be presented.