S
Spyros Diplas
Researcher at SINTEF
Publications - 87
Citations - 1740
Spyros Diplas is an academic researcher from SINTEF. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 20, co-authored 82 publications receiving 1410 citations. Previous affiliations of Spyros Diplas include University of Surrey & University of Oslo.
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XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures
Martin Fleissner Sunding,K. Hadidi,Spyros Diplas,Spyros Diplas,Ole Martin Løvvik,Ole Martin Løvvik,Truls Norby,Anette Eleonora Gunnæs +7 more
TL;DR: In this article, a technique is described for deposition of gold nanoparticles under vacuum, enabling consistent energy referencing of X-ray photoelectron spectra obtained from lanthanum hydroxide La(OH)3 and in situ treated Lanthanum oxide La2O3 powders.
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Corrosion of stainless steel 316L in simulated formation water environment with CO2–H2S–Cl−
TL;DR: A synergistic effect of high concentration of chloride and H 2 S on oxide formation and metal dissolution has been studied on 316L stainless steel by electrochemical measurements, inductive coupled plasma (ICP) and X-ray photoelectron spectroscopy (XPS) as mentioned in this paper.
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Covalent attachment of a bioactive hyperbranched polymeric layer to titanium surface for the biomimetic growth of calcium phosphates
TL;DR: A whole new methodology was developed based on covalently attaching a hyperbranched poly(ethylene imine) layer on Ti surface able to promote calcium phosphate formation in a next deposition stage to confirm the successful grafting of the hybrid layer.
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Elemental distribution and oxygen deficiency of magnetron sputtered ITO films
TL;DR: The atomic structure and composition of noninterfacial ITO and ITO-Si interfaces were studied with Transmission Electron Microscopy (TEM) and X-ray Photoelectron Spectroscopy (XPS) as discussed by the authors.
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Elemental distribution and oxygen deficiency of magnetron sputtered indium tin oxide films
TL;DR: In this paper, the atomic structure and composition of noninterfacial ITO and ITO-Si interfaces were studied with transmission electron microscopy and x-ray photoelectron spectroscopy (XPS).