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Stan Z. Li

Researcher at Westlake University

Publications -  625
Citations -  49737

Stan Z. Li is an academic researcher from Westlake University. The author has contributed to research in topics: Facial recognition system & Computer science. The author has an hindex of 97, co-authored 532 publications receiving 41793 citations. Previous affiliations of Stan Z. Li include Microsoft & Macau University of Science and Technology.

Papers
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Journal ArticleDOI

Dynamic Image-to-Class Warping for Occluded Face Recognition

TL;DR: DICW computes the image-to-class distance between a query face and those of an enrolled subject by finding the optimal alignment between the query sequence and all sequences of that subject along both the time dimension and within-class dimension.
Posted Content

Face Forgery Detection by 3D Decomposition

TL;DR: This paper considers a face image as the production of the intervention of the underlying 3D geometry and the lighting environment, and decompose it in a computer graphics view and proposes to utilize facial detail, which is the combination of direct light and identity texture, as the clue to detect the subtle forgery patterns.
Book ChapterDOI

Human Age Estimation Using Ranking SVM

TL;DR: Experimental results on MORPH and Multi-PIE databases validate the superiority of the rank based human age estimation over some state-of-the-art methods.
Journal ArticleDOI

Face alignment using view‐based direct appearance models

TL;DR: A novel appearance model, called direct appearance model (DAM), is proposed and its extended view‐based models are applied for multiview face alignment and it can converge more quickly and has higher accuracy.
Proceedings Article

Metric embedded discriminative vocabulary learning for high-level person representation

TL;DR: A metric embedded discriminative vocabulary learning for high-level person representation with application to person re-identification and a new and effective term is introduced which aims at making the same persons closer while different ones farther in the metric space.