Sun Boyang

Bio: Sun Boyang is an academic researcher. The author has contributed to research in topics: Structured light & Machining. The author has an hindex of 3, co-authored 4 publications receiving 23 citations.

CCD camera nonlinearity degree calibration method based on structured light three-dimensional measurement system

Abstract: The invention provides a CCD camera nonlinearity degree calibration method based on a structured light three-dimensional measurement system. The method comprises the steps that according to the measurement processes of the structured light three-dimensional measurement system, on the basis that a series of standard images which are projected by a projector and accord with linear distribution are collected, a standard image gray scale-camera collected image gray scale distribution curve is drawn after certain data processing so as to further calculate the nonlinearity degree of a CCD camera; because gray scale gradient is small when the standard images are grouped, and the number of images collected by the CCD camera is large, random errors are reduced, and nonlinearity degree measurement precision is improved; the CCD camera nonlinearity degree calibration method based on the structured light three-dimensional measurement system accords with conditions of the structured light three-dimensional measurement system, and is simple in calibration process, less in middle link, and accurate in nonlinearity degree calibration result.

Method for fast recovering surface phase of high-light object based on least square method

Abstract: The invention provides a method for fast recovering a surface phase of a high-light object based on the least square method. The method is different from an original method that valid gray values and invalid gray values in N optical grating pictures are directly substituted into a standard N-step phase shifting formula to solve the phase. The method comprises the steps that firstly, invalid pixel points and invalid gray values are removed, valid gray values of valid pixel points are directly used, a linear equation set is established according to the valid gray values, the optimal solution of the equation set is solved based on the least square method, the high-precision phase value is solved according to the optimal solution, and the phase value of the surface of the high-light object can be fast recovered. The method is simple in step, high in robustness and good in random error rejection capability, extra hardware facilities are not needed, the diaphragm and exposure time of a CCD camera do not need to be adjusted, the surface of the high-light object does not need to be processed, time is saved, the operation is fast, the measuring precision of the surface of the high-light object can be guaranteed, and the measuring accuracy is high.

Method for highlight body surface phase quick recovery based on recurrence method

Abstract: The invention provides a method for highlight body surface phase quick recovery based on a recurrence method. According to the method, a method that effective gray level values in the pixel point portion are directly used is adopted instead of the prior method that effective gray level values and invalid gray level values in N raster images are directly substituted into a phase solution formula, actual values of saturated gray level values are restored through the recurrence method, and therefore the accurate phase value of a highlight body surface is recovered. The method is simple in step, high in robustness, good in random error rejection capacity, free of requirements for adjusting a CCD camera diaphragm and time of exposure and the requirement for processing the highlight body surface, capable of saving time, rapid, capable of guaranteeing measurement accuracy of the highlight body surface and high in measurement accuracy.

Depth determining method and device and electronic equipment

Abstract: The embodiment of the invention provides a depth determining method and device and electronic equipment. The method comprises the following steps: acquiring a colorful image and a depth image which are acquired by a camera and then are output; carrying out image identification based on the colorful image and determining a first image region recorded with a characteristic body in the colorful image; determining a second image region corresponding to the first image region in the depth image according to a pixel corresponding relation between the colorful image and the depth image; determining a characteristic body depth value of the second image region based on depth information corresponding to a pixel in the second image region. According to the embodiment, the characteristic body depth value of the characteristic body can be obtained under the condition that the precision of the depth image is lower and the characteristic body is difficult to identify.

High-dynamic performance three-dimensional measurement method based on adaptive grating projection

Abstract: The invention discloses a high-dynamic performance three-dimensional measurement method based on adaptive grating projection, and the method comprises the steps: setting a saturation threshold value of an image; carrying out the projection of an all-white image for a to-be-measured object, collecting the image through a camera, changing the gray scale of the projection image, generating a proper grating, and enabling the camera image not to be saturate; enabling the projection to sequentially pass through the gratings adjusted for the first time, collecting an image, solving an absolute phase through a phase shift method and a Gray code method, and completing the matching of the camera image coordinates and the projection grating image coordinates of an excessively bright region through the phase; projecting the image, collecting the image through the camera, adjusting the gray scale of the projection image pixel by pixel based on a coordinate matching result, and generating a final adaptive grating map; projecting a finally generated grating map, collecting the image, and solving an absolute phase through the phase shift method and the Gray code method; and calculating the three-dimensional coordinate information of the measured object according to a space intersection method through the calibrated camera parameters and the solved absolute phase. The method finally achieves the precise three-dimensional measurement with the high dynamic performances.

Assembly line product three-dimensional surface type detection method based on phase gradient threshold

Abstract: The invention belongs to the on-line three-dimensional surface type detection field, and especially discloses an assembly line product three-dimensional surface type detection method based on a phase gradient threshold. The invention solves the problems of the prior art, fully takes regard of the balance between measurement speed and precision required by on-line three-dimensional surface type detection, and provides an assembly line product three-dimensional surface type real time detection method based on a phase gradient threshold. The method comprises: obtaining the whole phase information of a detected object through an Fourier transform method; using a phase gradient threshold as an image characteristic to participate in correlative operation to obtain phase shift stripes; expanding a binary phase shift gradient graph to obtain an object surface abrupt change area; and finally employing the least square method to obtain the phase distribution of the abrupt change area through iteration computation, and to modify FTP calculating results in order to improve phase obtaining precision.

Fast phase extraction method for three random phase-shifted interferograms

Abstract: The present invention provides a fast phase extraction method for three random phase-shifted interferograms. The method comprises the steps of (S1) collecting three random interferograms, (S2) carrying out pairwise subtraction operations on the collected random interferograms, (S3) carrying out an addition or subtraction operation on the random interferograms, (S4) normalizing an elliptical formula obtained by simplification and performing super least square elliptic fitting to solve ellipse parameters, and (S5) solving a phase. The method has the advantages that an ellipse parameter formula is through two steps of addition and subtraction operations, influence of background light intensity can be reduced or even eliminated, then the super least square elliptic fitting is used to obtain the ellipse parameters, the phase can be directly calculated through the ellipse parameters, the method is not limited by the fringes in the interferograms, and the phase can be precisely and quickly extracted from the three random phase-shifted interferograms.

Cutter-axis vector optimization method based on multi-objective constraints and system

Abstract: The invention belongs to the field of milling processing, and particularly discloses a cutter-axis vector optimization method based on multi-objective constraints and system. The method comprises steps: S1, a multi-objective constrained cutter-axis vector optimization model is built according to cutter axis optimization requirements; S2, discretization is carried out on the cutter-axis vector optimization model to obtain a discrete cutter-axis vector optimization model; S3, the discrete cutter-axis vector optimization model is converted to a cutter-axis vector optimization model with a variables in a local coordinate system as an optimization variable; and S4, a cutter-axis feasible region without over cutting in the cutter-axis vector optimization model is calculated, and the optimized cutter-axis vector is solved. The cutter-axis vector and the processing path can be ensured to be more stable, the cutter can be prevented from generating over cutting or collision during a processing process, the method and the system are applicable to workpiece surfaces with different parameterization, the processing precision is high, and the surface quality of a processing working piece is good.