T. R. Albrecht

Bio: T. R. Albrecht is an academic researcher from Stanford University. The author has contributed to research in topics: Frequency modulation & Cantilever. The author has an hindex of 4, co-authored 4 publications receiving 4134 citations.

Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity

Abstract: A new frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum (<10−3 Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional ‘‘slope detection,’’ the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q∼50 000) versus slope detection in air (Q∼100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin‐film CoPtCr magnetic disk. In the future, the increased sensitivi...

Frequency modulation detection using highdkantilevers for enhanced force microscope sensitivity

Abstract: A new frequency modulation (FM) technique has been demonstrated which ennances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum ( < 10 ’ Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional “slope detection,” the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q50 000) versus slope detection in air (Q100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin-film CoPtCr magnetic disk. In the future, the increased sensitivity offered by this technique should extend the range of problems accessible by force microscopy.

Imaging and modification of polymers by scanning tunneling and atomic force microscopy

Abstract: Direct imaging of ultrathin organic films on solid surfaces is important for a variety of reasons; in particular, the use of such films as ultrathin resists for nanometer scale fabrication and information recording requires that we understand their microstrucure. We have used the Langmuir–Blodgett technique to prepare monolayer and submonolayer films of poly(octadecylacrylate) (PODA) and poly(methylmethacrylate) (PMMA) on graphite substrates. Atomic scale images obtained with the scanning tunneling microscope (STM) and the atomic force microscope of the PODA films showed a variety of structures, including isolated narrow fibrils, parallel groups of fibrils, and an ordered structure consistent with the side chain crystallization expected with that material. The fibrils observed are interpreted as individual polymer chains or small bundles of parallel chains. Images of the PMMA samples show no ordered regions. By applying voltage pulses on the STM tip, we were able to locally modify and apparently cut throu...

Observation and manipulation of polymers by scanning tunnelling and atomic force microscopy

Abstract: : The properties of monolayer films of organic materials are important for a variety of technologies. We have employed the STM and AFM to study Langmuir-Blodgett films of a variety of polymers on substrates of graphite, molybdenum sulfate, and gold (111) on mica. The polymers were poly(octadecyl acrylate) (PODA), atactic and syndiotactic poly(methyl methacrylate) (PMMA) and poly(2-methyl 1-pentene sulfone) (PMPS). One striking feature was the degree of order observed; a second was the morphological difference between films of submonolayer thickness (long thin fibrils) and those of at least monolayer thickness (lumpy structures arranged in domains). By pulsing the STM bias voltage to values in excess of 4 V, we were able to bring about local modification of the polymer morphology.

Principles of nano-optics

Abstract: 1. Introduction 2. Theoretical foundations 3. Propagation and focusing of optical fields 4. Spatial resolution and position accuracy 5. Nanoscale optical microscopy 6. Near-field optical probes 7. Probe-sample distance control 8. Light emission and optical interaction in nanoscale environments 9. Quantum emitters 10. Dipole emission near planar interfaces 11. Photonic crystals and resonators 12. Surface plasmons 13. Forces in confined fields 14. Fluctuation-induced phenomena 15. Theoretical methods in nano-optics Appendices Index.

Advances in atomic force microscopy

Abstract: This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.