T
Takashi Ohmori
Researcher at Tokyo Metropolitan University
Publications - 12
Citations - 265
Takashi Ohmori is an academic researcher from Tokyo Metropolitan University. The author has contributed to research in topics: Thin film & Scanning tunneling microscope. The author has an hindex of 9, co-authored 12 publications receiving 260 citations.
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Effects of HF solution in the electroless deposition process on silicon surfaces
TL;DR: In this paper, the influence of HF concentration on the initial stages of electroless deposition for various metals (Al, Au, Cu, Sn, and Pd) onto silicon using atomic force microscopy.
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Influence of sputtering parameters on electrochemical CO2 reduction in sputtered Au electrode
TL;DR: In this article, the influence of the sputtering parameters (rf power, Ar pressure during deposition, and the distance between substrate and target) and thickness on the reduction potential and products, CO and H 2, was studied in KCl and KHCO 3 using a Au electrode prepared by sputtering.
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Morphological Transformation of Palladium Caused by Measurement of a Scanning Tunneling Microscope
TL;DR: In this paper, it was observed that scanning the surface of palladium for imaging with a scanning tunneling microscope (STM) caused the morphological change of the surface: the morphology of Pd was transformed from a rough surface to a flat one.
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Fabrication of Pt microporous electrodes from anodic porous alumina and immobilization of GOD into their micropores
TL;DR: In this article, a two-step replication method was applied to the preparation of a microporous Pt membrane, which has been widely used as an electrode material, and the surface area of the Pt was evaluated by proton adsorption reaction in an acidic electrolyte.
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Development of high throughput evaluation for photocatalyst thin-film
TL;DR: In this article, a high throughput evaluation of photocatalytic activity using two-dimensional pH imaging method, synthesis of thin-film libraries using laser molecular beam epitaxy (MBE) technique combined with mask system and analysis using twodimensional fluorescence X-ray was developed.