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Taskin Kocak

Researcher at Bahçeşehir University

Publications -  105
Citations -  4633

Taskin Kocak is an academic researcher from Bahçeşehir University. The author has contributed to research in topics: Network packet & Throughput (business). The author has an hindex of 18, co-authored 105 publications receiving 4220 citations. Previous affiliations of Taskin Kocak include Duke University & University of Bristol.

Papers
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Journal ArticleDOI

Smart Grid Technologies: Communication Technologies and Standards

TL;DR: The main objective of this paper is to provide a contemporary look at the current state of the art in smart grid communications as well as to discuss the still-open research issues in this field.
Journal ArticleDOI

A Survey on Smart Grid Potential Applications and Communication Requirements

TL;DR: This paper overviews the issues related to the smart grid architecture from the perspective of potential applications and the communications requirements needed for ensuring performance, flexible operation, reliability and economics.
Journal ArticleDOI

Smart Grid and Smart Homes: Key Players and Pilot Projects

TL;DR: The smart grid is envisioned as providing a communications network for the energy industry, similar to that which the Internet now provides for business and personal communications as mentioned in this paper, which offers new business opportunities for different kind of industries, such as smart-meter vendors, electric utilities, and telecom operators from all around the world.
Proceedings ArticleDOI

A low power lookup technique for multi-hashing network applications

TL;DR: This work presents a novel lookup technique and architecture to decrease the power consumption of multi-hashing schemes, predominantly Bloom filters, in hardware by employing the low power lookup technique.
Journal ArticleDOI

Matrix Codes for Reliable and Cost Efficient Memory Chips

TL;DR: The proposed method, called a Matrix code, combines Hamming and Parity codes to assure the improvement of reliability and yield of the memory chips in the presence of high defects and multiple bit-upsets and achieves reliability increase by more than 50% in some cases.