Thomas Tybell

TL;DR: The electric field dependence of the domain wall velocity demonstrates that domain wall motion in ferroelectric thin films is a creep process, with the critical exponent mu close to 1.The dimensionality of the films suggests that disorder is at the origin of the observed creep behavior.

TL;DR: In this article, the authors investigated the ferroelectric properties of thin tetragonal single-crystalline perovskite films of Pb(Zr0.2Ti0.8)O3 grown by off-axis rf magnetron sputtering.

TL;DR: In this paper, a modified Pechini method was used to reduce the rhombohedral distortion from cubic structure by decreasing particle size accompanied by decreasing polarization inferred from atomic displacements found by Rietveld refinement of X-ray powder diffraction data, and the Neel temperature was correlated with the volume of the crystallites and the polar displacements of cations.

TL;DR: In this paper, a scanning probe microscope was used to induce local, nonvolatile field effects in epitaxial, ferroelectric Pb(Zr0.52Ti0.48)O3/SrRuO3heterostructures.

TL;DR: The polarization field of the ferroelectric oxide lead zirconate titanate was used to tune the critical temperature of the hightemperature superconducting cuprate gadolinium barium copper oxide in a reversible, nonvolatile fashion.