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Tien D. Bui

Researcher at Concordia University

Publications -  183
Citations -  4028

Tien D. Bui is an academic researcher from Concordia University. The author has contributed to research in topics: Image segmentation & Wavelet transform. The author has an hindex of 30, co-authored 181 publications receiving 3759 citations. Previous affiliations of Tien D. Bui include Concordia University Wisconsin & McGill University.

Papers
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Journal ArticleDOI

Translation-invariant denoising using multiwavelets

TL;DR: This work extends Coifman and Donoho's TI single wavelet denoising scheme to multiwavelets and Experimental results show that TI multiwavelet Denoising is better than the single case for soft thresholding.
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Multiwavelets denoising using neighboring coefficients

TL;DR: Experimental results show that this approach is better than the conventional approach, which only uses the term-by-term multiwavelet denoising, and it outperforms neighbor single wavelet Denoising for some standard test signals and real-life images.
Proceedings ArticleDOI

Investigating age invariant face recognition based on periocular biometrics

TL;DR: This paper uses unsupervised discriminant projection (UDP) to build subspaces on WLBP featured periocular images and gain 100% rank-1 identification rate and 98% verification rate at 0.1% false accept rate on the entire FG-NET database.
Proceedings ArticleDOI

Age estimation using Active Appearance Models and Support Vector Machine regression

TL;DR: A novel age estimation technique that combines Active Appearance Models (AAMs) and Support Vector Machines (SVMs) to dramatically improve the accuracy of age estimation over the current state-of-the-art techniques is introduced.
Journal ArticleDOI

Multivariate statistical modeling for image denoising using wavelet transforms

TL;DR: The general estimation rule in the wavelet domain is derived to obtain the denoised coefficients from the noisy image based on the multivariate statistical theory and a parametric multivariate generalized Gaussian distribution model is defined which closely fits the sample distribution.