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Todd H. Hubing

Bio: Todd H. Hubing is an academic researcher from Clemson University. The author has contributed to research in topics: Printed circuit board & Electromagnetic compatibility. The author has an hindex of 32, co-authored 173 publications receiving 3724 citations. Previous affiliations of Todd H. Hubing include Missouri University of Science and Technology & University of Missouri.


Papers
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Journal ArticleDOI
TL;DR: This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility at the IC level over the past 40 years to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.
Abstract: Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.

289 citations

Journal ArticleDOI
TL;DR: In this paper, two EMI source mechanisms have been identified: one associated with a differential-mode voltage and another associated with differential mode current, both of which result in a common-mode current on an attached cable.
Abstract: Fundamental EMI source mechanisms leading to common-mode radiation from printed circuit boards with attached cables are presented in this paper. Two primary EMI source mechanisms have been identified: one associated with a differential-mode voltage and another associated with a differential-mode current, both of which result in a common-mode current on an attached cable. These mechanisms can he used to relate printed circuit layout geometries to EMI sources. The two mechanisms are demonstrated through numerical and experimental results, and an example from a production printed-circuit design is presented.

246 citations

Journal ArticleDOI
TL;DR: In this article, a decoupling strategy for multilayer boards must account for the low inductance and relatively high capacitance of the power bus, which is not appropriate for one-sided or two-sided printed circuit boards.
Abstract: Guidelines for the selection and placement of decoupling capacitors that work well for one-sided or two-sided printed circuit boards are not appropriate for multilayer boards with power and ground planes. Boards without internal planes take advantage of the power bus inductance to help decouple components at the higher frequencies. An effective decoupling strategy for multilayer boards must account for the low inductance and relatively high capacitance of the power bus. >

200 citations

Journal ArticleDOI
TL;DR: In this paper, the FDTD model was used to investigate the EMI from a test enclosure with slots and apertures excited by interior sources in a rectangular test enclosure, and the results indicated that radiation at cavity mode resonances through slots and aperture modes of nonresonant dimensions can be as significant as radiation at aperture or slot resonances.
Abstract: Electromagnetic interference (EMI) from slots and apertures resulting from coupling of interior sources through enclosure cavity modes in a rectangular test enclosure is reported. EMI from a specially designed test enclosure with slots or apertures excited by interior sources was studied experimentally and with finite-difference time-domain (FDTD) modeling. The measurements and FDTD modeling agree well. The results indicate that radiation at cavity mode resonances through slots and apertures of nonresonant dimensions can be as significant as the radiation at aperture or slot resonances. The agreement between the FDTD modeling and measurements demonstrates the usefulness of FDTD for investigating aspects of shielding enclosure design such as coupling to slots and apertures and slot interactions.

165 citations

Journal ArticleDOI
TL;DR: In this article, the authors investigated the effect of placing SMT capacitors in proximity to ICs in multilayer PCB designs and demonstrated that local decoupling can provide high-frequency benefits for certain PCB geometries through mutual inductive coupling between closely spaced vias.
Abstract: Noise on a dc power-bus that results from device switching, as well as other potential mechanisms, is a primary source of many signal integrity (SI) and electromagnetic interference (EMI) problems. Surface mount technology (SMT) decoupling capacitors are commonly used to mitigate this power-bus noise. A critical design issue associated with this common practice in high-speed digital designs is placement of the capacitors with respect to the integrated circuits (ICs). Local decoupling, namely, placing SMT capacitors in proximity to ICs, is investigated in this study. Multilayer PCB designs that employ entire layers or area fills for power and ground in a parallel plate structure are considered. The results demonstrate that local decoupling can provide high-frequency benefits for certain PCB geometries through mutual inductive coupling between closely spaced vias. The associated magnetic flux linkage is between the power and ground layers. Numerical modeling using an integral equation formulation with circuit extraction is used to quantify the local decoupling phenomenon. Local decoupling can effectively reduce high-frequency power-bus noise, though placing capacitors adjacent to ICs may limit routing flexibility, and tradeoffs need to be made based on design requirements. Design curves are generated as a function of power-bus layer thickness and SMT capacitor/IC spacing using the modeling approach to quantify the power-bus noise reduction for decoupling capacitors located adjacent to devices. Measurement data is provided to corroborate the modeling approach.

135 citations


Cited by
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Journal ArticleDOI
TL;DR: The as-fabricated PCHMs can be promising candidates as highly effective microwave absorbers, and the design philosophy can be extended to other spherical absorbers.
Abstract: In this work, mesoporous carbon hollow microspheres (PCHMs) with designable mesoporous shell and interior void are constructed by a facile in situ stober templating approach and a pyrolysis-etching process. The PCHMs are characterized by scanning electron microscopy, transmission electron microscopy, X-ray photoelectron spectra, Raman spectroscopy, and nitrogen adsorption and desorption system. A uniform mesoporous shell (pore size 4.7 nm) with a thickness of 55 nm and a cavity size of 345 nm is realized. The composite of paraffin mixed with 20 wt % PCHMs exhibits a minimum reflection coefficient (RCmin) of −84 dB at 8.2 GHz with a sample thickness of 3.9 mm and an effective absorption bandwidth (EAB) of 4.8 GHz below −10 dB (>90% electromagnetic wave is attenuated). Moreover, the composite of phenolic resin mixed with 20 wt % PCHMs exhibits an ultrawide EAB of 8 GHz below −10 dB with a thinner thickness of 2.15 mm. Such excellent electromagnetic wave absorption properties are ascribed to the large carbon...

395 citations

Journal ArticleDOI
TL;DR: Deep learning is used to detect physical-layer attributes for the identification of cognitive radio devices, and the method is based on the empirical principle that manufacturing variability among wireless transmitters that conform to the same standard creates unique, repeatable signatures in each transmission.
Abstract: With the increasing presence of cognitive radio networks as a means to address limited spectral resources, improved wireless security has become a necessity. In particular, the potential of a node to impersonate a licensed user demonstrates the need for techniques to authenticate a radio's true identity. In this paper, we use deep learning to detect physical-layer attributes for the identification of cognitive radio devices, and demonstrate the performance of our method on a set of IEEE 802.15.4 devices. Our method is based on the empirical principle that manufacturing variability among wireless transmitters that conform to the same standard creates unique, repeatable signatures in each transmission, which can then be used as a fingerprint for device identification and verification. We develop a framework for training a convolutional neural network using the time-domain complex baseband error signal and demonstrate 92.29% identification accuracy on a set of seven 2.4 GHz commercial ZigBee devices. We also demonstrate the robustness of our method over a wide range of signal-to-noise ratios.

353 citations

Book
11 Apr 2005
TL;DR: In this paper, the three most popular full-wave methods, the Finite Difference Time Domain Method (FDTM), the Method of Moments (MOM) and the Fine Element Method (FEEM), are introduced by way of one or two-dimensional problems.
Abstract: The numerical approximation of Maxwell's equations, Computational Electromagnetics (CEM), has emerged as a crucial enabling technology for radio-frequency, microwave and wireless engineering. The three most popular 'full-wave' methods - the Finite Difference Time Domain Method, the Method of Moments and the Finite Element Method - are introduced in this book by way of one or two-dimensional problems. Commercial or public domain codes implementing these methods are then applied to complex, real-world engineering problems, and a careful analysis of the reliability of the results obtained is performed, along with a discussion of the many pitfalls which can result in inaccurate and misleading solutions. The book will empower readers to become discerning users of CEM software, with an understanding of the underlying methods, and confidence in the results obtained. It also introduces readers to the art of code development. Aimed at senior undergraduate/graduate students taking CEM courses and practising engineers in the industry.

325 citations