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V. Jagadeesh Kumar

Researcher at Indian Institute of Technology Madras

Publications -  84
Citations -  744

V. Jagadeesh Kumar is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Signal conditioning & Capacitive sensing. The author has an hindex of 15, co-authored 83 publications receiving 637 citations. Previous affiliations of V. Jagadeesh Kumar include Indian Institutes of Technology.

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Proceedings ArticleDOI

Inductive-Capacitive Coupled Probe for Non-Contact Measurement of Liquid Conductivity

TL;DR: The method proposed ensures that the measurement of the voltage drop across the column is independent of the values of the coupling capacitances of the capacitive coupled electrode, so any deviation in the fabrication of the probe has negligible influence on the measured conductivity.
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A novel variable reluctance-hall effect transduction technique based displacement sensor

TL;DR: Finite Element Analysis of the proposed sensor and the results from the subsequent linearization approach establishes the efficacy of the suggested sensor.
Proceedings ArticleDOI

A modified Direct Digital Converter for resistive sensors in bridge form

TL;DR: In this paper, a modified DDC that can tolerate mismatch between the four sensing elements of a bridge type resistive sensor is presented. But, the worst case error observed from the improved DDC scheme is only ± 0.24%.

Novel Signal Conditioning Circuit for Push-Pull Type

TL;DR: In this article, a signal conditioning circuit suitable for push-pull type capacitive transducers is proposed, which is capable of providing a linear output over a wide range of values of the physical quantity being measured even when the transducer output has an inverse relationship with the measurand.
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Virtual instrument to measure the magnetic properties of annealed components

TL;DR: A suitable magnetic fixture that can accommodate test samples of various inner and outer diameters and a virtual instrument that has been developed to perform the comparison method of testing for the annealed samples are presented.