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Showing papers by "V. Kamakoti published in 2014"


Journal ArticleDOI
TL;DR: It is shown that X-bit statistics can be used to reorder test vectors on scan based architectures realized using toggle-masking flip flops and XStat improved the running time for Test Vector Ordering and X-filling phases compared to the best known techniques.
Abstract: Excessive power dissipation can cause high voltage droop on the power grid, leading to timing failures. Since test power dissipation is typically higher than functional power, test peak power minimization becomes very important in order to avoid test induced timing failures. Test cubes for large designs are usually dominated by don't care bits, making X-leveraging algorithms promising for test power reduction. In this paper, we show that X-bit statistics can be used to reorder test vectors on scan based architectures realized using toggle-masking flip flops. Based on this, the paper also presents an algorithm namely balanced X-filling that when applied to ITC'99 circuits, reduced the peak capture power by 7.4% on the average and 40.3% in the best case. Additionally XStat improved the running time for Test Vector Ordering and X-filling phases compared to the best known techniques.

7 citations


Journal ArticleDOI
TL;DR: A comparative study of different techniques reported in the literature for border minimization problem and current open challenges in DNA microarrays is presented.
Abstract: Genomic analysis is a gaining prominence, specifically in the areas of forensics and drug discovery. DNA microarrays are the devices employed for performing the genomic analysis. Border minimization problem (BMP) is a well-known optimization problem in the automated design of DNA microarrays. The problem of BMP can be considered from two perspectives, namely placement and embedding. This paper presents a comparative study of different techniques reported in the literature for BMP and current open challenges.

6 citations


Proceedings ArticleDOI
05 Jan 2014
TL;DR: The paper proposes a Progressive Configuration Aware (ProCA) criticality analysis framework, that is 10X faster than the state-of-the-art, to identify logic which is functionally-critical to output quality, and demonstrates how a low powered tunable stochastic design can be derived.
Abstract: With increasing integration of capabilities into mobile application processors, a host of imaging operations that were earlier performed in software are now implemented in hardware [1]. Though imaging applications are inherently error resilient, the complexity of such designs has increased over time and thus identifying logic that can be leveraged for energy-quality trade-offs has become difficult. The paper proposes a Progressive Configuration Aware (ProCA) criticality analysis framework, that is 10X faster than the state-of-the-art, to identify logic which is functionally-critical to output quality. This accounts for the various modes of operation of the design. Through such a framework, we demonstrate how a low powered tunable stochastic design can be derived. The proposed methodology uses layered synthesis and voltage scaling mechanisms as primary tools for power reduction. We demonstrate the proposed methodology on a production quality imaging IP implemented in 28nm low leakage technology. For the tunable stochastic imaging IP, we gain up to 10.57% power reduction in exact mode and up to 32.53% power reduction in error tolerant mode (30dB PSNR), with negligible design overhead.

4 citations