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Author

Vaithiyanathan Sugumaran

Bio: Vaithiyanathan Sugumaran is an academic researcher from VIT University. The author has contributed to research in topic(s): Fault (power engineering) & Reliability (statistics). The author has co-authored 1 publication(s).

Papers
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Journal ArticleDOI
25 May 2021
TL;DR: This article presents the use of a deep convolutional neural network (CNN) to extract image features and perform an effective classification of faults by machine learning (ML) algorithms.
Abstract: Fault diagnosis plays a significant role in enhancing the useful lifetime, power output, and reliability of photovoltaic modules (PVM). Visual faults such as burn marks, delamination, discoloration...