V
Viktoras Gružinskis
Publications - 78
Citations - 752
Viktoras Gružinskis is an academic researcher. The author has contributed to research in topics: Monte Carlo method & Terahertz radiation. The author has an hindex of 15, co-authored 78 publications receiving 733 citations.
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Journal ArticleDOI
Terahertz spectroscopy of plasma waves in high electron mobility transistors
Philippe Nouvel,Hugues Marinchio,Jeremie Torres,Christophe Palermo,D. Gasquet,Laurent Chusseau,Luca Varani,Pavel Shiktorov,E. Starikov,Viktoras Gružinskis +9 more
TL;DR: In this article, the authors report on systematic measurements of resonant plasma waves oscillations in several gate-length InGaAs high electron mobility transistors (HEMTs) and compare them with numerical results from a specially developed model.
Journal ArticleDOI
Transfer-field methods for electronic noise in submicron semiconductor structures
Pavel Shiktorov,E. Starikov,Viktoras Gružinskis,Tomas Gonzalez,Javier Mateos,Daniel Pardo,Luca Reggiani,Luca Varani,J. C. Vaissiere +8 more
Journal ArticleDOI
Hydrodynamic modeling of optically excited terahertz plasma oscillations in nanometric field effect transistors
Hugues Marinchio,G. Sabatini,Christophe Palermo,J. Pousset,Jérémi Torres,Laurent Chusseau,Luca Varani,Pavel Shiktorov,E. Starikov,Viktoras Gružinskis +9 more
TL;DR: In this article, a hydrodynamic model is presented to simulate the excitation by optical beating of plasma waves in nanometric field effect transistors, where the biasing conditions are whatever possible from Ohmic to saturation conditions.
Journal ArticleDOI
Monte Carlo simulation of the generation of terahertz radiation in GaN
E. Starikov,Pavel Shiktorov,Viktoras Gružinskis,Luca Reggiani,Luca Varani,J. C. Vaissière,Jian Hui Zhao +6 more
TL;DR: In this paper, the conditions for microwave power generation at low temperatures under optical phonon emission are analyzed by Monte Carlo simulations of both small and large-signal responses in bulk zinc blende and wurtzite GaN.
Journal ArticleDOI
Noise temperature of n + nn + GaAs structures
TL;DR: The noise temperature of GaAs two-terminal structures of micrometer and submicrometer lengths is theoretically analyzed as a function of frequency and applied voltage and very good agreement is found between theory and available experiments.