W. G. Sainty

Bio: W. G. Sainty is an academic researcher from Commonwealth Scientific and Industrial Research Organisation. The author has contributed to research in topics: Thin film & Evaporation (deposition). The author has an hindex of 17, co-authored 24 publications receiving 1269 citations.

Ion-beam-assisted deposition of thin films.

Abstract: Some effects on the properties of electron-beam evaporated thin films produced by ion bombardment of the growing film are reported. Substantial increases in the packing densities of SiO2 , TiO2 , and ZrO2 films have been produced as measured by the reduction in the adsorption of moisture when the films are exposed to a humid atmosphere. In a ZrO2-SiO2 multilayer interference filter, changes in the wavelength of the peak transmittance on exposure to the atmosphere have been reduced from 8 nm for films deposited without ion bombardment to <1 nm for ion-beam-assisted films.

Modification of the optical and structural properties of dielectric ZrO2 films by ion‐assisted deposition

Abstract: Low‐energy bombardment by argon and oxygen ions has been used in the deposition of thin dielectric films of ZrO2. The film packing density has been improved from 0.83 to unity with a corresponding increase in the refractive index from 1.84 to 2.19. The highest stable refractive index measured was 2.23 for oxygen ion‐assisted deposition of ZrO2 on a substrate heated to 300 °C. Ion bombardment during condensation of evaporated ZrO2 on a room temperature substrate results in crystallization into the cubic phase which is consistent with previous studies of ion impact crystallization by thermal‐spike processes. At elevated substrate temperatures the monoclinic phase is also present.

Properties of CeO2 thin films prepared by oxygen-ion-assisted deposition.

Abstract: Thin films have been prepared by electron-beam evaporation of CeO2, where the growing film has been bombarded with oxygen ions. The packing density of the films has been increased from ∼0.55 without ion bombardment to unity with bombardment as determined by moisture adsorption measurements. The refractive index, extinction coefficient, and scattering loss are reported for a range of ion energies from 50 to 1200 eV. The ratio of ion-current density to film growth rate required to produce films that did not adsorb moisture was found to be a minimum for ion energies in the 300–600-eV range. Absorption and scatter losses are smallest for the lower ion energies and the crystal structure of CeO2 films is relatively stable under ion bombardment although ion-assisted films tend to be less crystalline than evaporated layers.

Ion-assisted deposition of mixed Tio2-Sio2 films

Abstract: Mixed thin films of TiO2 and SiO2 were produced by coevaporation from separate electron‐beam sources and simultaneous bombardment of the growing film with oxygen ions. The optical properties of the films were determined during growth by in situ ellipsometry and the surface composition of the deposited films studied by in situ ion scattering spectroscopy, ex situ x‐ray photoelectron spectroscopy, and energy filtered electron diffraction. The correlation between the optical and surface characterization is presented. There is evidence of local variations in the relative concentrations of TiO2 and SiO2. The position of the Si 2p binding energy depends on the TiO2 content in the film, indicating the possible formation of an intimate mixture.

Protective dielectric coatings produced by ion-assisted deposition.

Abstract: Optically transparent dielectric films, when prepared by thermal evaporation or sputtering, have had limited use for many applications due to their permeability and lack of stability. We report on protective dielectric films produced by ion-beam-assisted deposition which demonstrate significant improvements over films produced by conventional deposition techniques. This result can be explained in terms of the increased packing density of ion-assisted films over the porous columnar microstructure usually associated with evaporated films. In addition, ion bombardment of the metal films produced the most stable structures and also substantially improved the adhesion of the films. The endurance under chemical attack of these films was found to be limited by the surface finish of the substrates.

Handbook of physical vapor deposition (PVD) processing

Abstract: This updated version of the popular handbook further explains all aspects of physical vapor deposition (PVD) process technology from the characterizing and preparing the substrate material, through deposition processing and film characterization, to post-deposition processing. The emphasis of the new edition remains on the aspects of the process flow that are critical to economical deposition of films that can meet the required performance specifications, with additional information to support the original material. The book covers subjects seldom treated in the literature: substrate characterization, adhesion, cleaning and the processing. The book also covers the widely discussed subjects of vacuum technology and the fundamentals of individual deposition processes. However, the author uniquely relates these topics to the practical issues that arise in PVD processing, such as contamination control and film growth effects, which are also rarely discussed in the literature. In bringing these subjects together in one book, the reader can understand the interrelationship between various aspects of the film deposition processing and the resulting film properties. The author draws upon his long experience with developing PVD processes and troubleshooting the processes in the manufacturing environment, to provide useful hints for not only avoiding problems, but also for solving problems when they arise. He uses actual experiences, called 'war stories', to emphasize certain points. Special formatting of the text allows a reader who is already knowledgeable in the subject to scan through a section and find discussions that are of particular interest. The author has tried to make the subject index as useful as possible so that the reader can rapidly go to sections of particular interest. Extensive references allow the reader to pursue subjects in greater detail if desired. The book is intended to be both an introduction for those who are new to the field and a valuable resource to those already in the field. The discussion of transferring technology between R&D and manufacturing provided in Appendix 1, will be of special interest to the manager or engineer responsible for moving a PVD product and process from R&D into production. Appendix 2 has an extensive listing of periodical publications and professional societies that relate to PVD processing. The extensive Glossary of Terms and Acronyms provided in Appendix 3 will be of particular use to students and to those not fully conversant with the terminology of PVD processing or with the English language. This title is fully revised and updated to include the latest developments in PVD process technology. It includes 'War stories' drawn from the author's extensive experience emphasize important points in development and manufacturing. Appendices include listings of periodicals and professional societies, terms and acronyms, and material on transferring technology between R&D and manufacturing.

Properties of diamond-like carbon

Abstract: This paper revies the preparation and properties of hard forms of amorphous carbon and hydrogenated amorphous carbon, often known as diamond-like carbon. Properties such as the hydrogen content, sp 3 content, optical gap, refractive index, hardness, elastic modulus and friction and their dependence on the deposition conditions are described. Models of the electronic structure and mechanical properties are used to relate the physical properties to the atomic structure.

Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

Abstract: Inhomogeneities in thin films have a large influence on the optical transmission spectrum. If not corrected for, this may lead to too large calculated values for the absorption coefficient or the apparent presence of an absorption band tail as well as serious errors in the values of refractive index and thickness. The effects of thickness variation, surface roughness and variation in refractive index on the transmission spectrum are analysed. Analytical expressions are derived from which all the optical constants of an inhomogeneous film can be calculated from the transmission spectrum.