William O. Meeker

Bio: William O. Meeker is an academic researcher from Iowa State University. The author has contributed to research in topics: Point estimation. The author has an hindex of 1, co-authored 1 publications receiving 990 citations.

Using Degradation Measures to Estimate a Time-to-Failure Distribution

Abstract: Some life tests result in few or no failures. In such cases, it is difficult to assess reliability with traditional life tests that record only time to failure. For some devices, it is possible to obtain degradation measurements over time, and these measurements may contain useful information about product reliability. Even with little or no censoring, there may be important practical advantages to analyzing degradation data. If failure is defined in terms of a specified level of degradation, a degradation model defines a particular time-to-failure distribution. Generally it is not possible to obtain a closed-form expression for this distribution. The purpose of this work is to develop statistical methods for using degradation measures to estimate a time-to-failure distribution for a broad class of degradation models. We use a nonlinear mixed-effects model and develop methods based on Monte Carlo simulation to obtain point estimates and confidence intervals for reliability assessment.

Reliability Engineering and System Safety

Abstract: This paper presents a polynomial dimensional decomposition (PDD) method for global sensitivity analysis of stochastic systems subject to independent random input following arbitrary probability distributions. The method involves Fourier-polynomial expansions of lower-variate component functions of a stochastic response by measure-consistent orthonormal polynomial bases, analytical formulae for calculating the global sensitivity indices in terms of the expansion coefficients, and dimension-reduction integration for estimating the expansion coefficients. Due to identical dimensional structures of PDD and analysis-of-variance decomposition, the proposed method facilitates simple and direct calculation of the global sensitivity indices. Numerical results of the global sensitivity indices computed for smooth systems reveal significantly higher convergence rates of the PDD approximation than those from existing methods, including polynomial chaos expansion, random balance design, state-dependent parameter, improved Sobol’s method, and sampling-based methods. However, for non-smooth functions, the convergence properties of the PDD solution deteriorate to a great extent, warranting further improvements. The computational complexity of the PDD method is polynomial, as opposed to exponential, thereby alleviating the curse of dimensionality to some extent. Mathematical modeling of complex systems often requires sensitivity analysis to determine how an output variable of interest is influenced by individual or subsets of input variables. A traditional local sensitivity analysis entails gradients or derivatives, often invoked in design optimization, describing changes in the model response due to the local variation of input. Depending on the model output, obtaining gradients or derivatives, if they exist, can be simple or difficult. In contrast, a global sensitivity analysis (GSA), increasingly becoming mainstream, characterizes how the global variation of input, due to its uncertainty, impacts the overall uncertain behavior of the model. In other words, GSA constitutes the study of how the output uncertainty from a mathematical model is divvied up, qualitatively or quantitatively, to distinct sources of input variation in the model [1].

Residual-life distributions from component degradation signals: A Bayesian approach

Abstract: Real-time condition monitoring is becoming an important tool in maintenance decision-making. Condition monitoring is the process of collecting real-time sensor information from a functioning device in order to reason about the health of the device. To make effective use of condition information, it is useful to characterize a device degradation signal, a quantity computed from condition information that captures the current state of the device and provides information on how that condition is likely to evolve in the future. If properly modeled, the degradation signal can be used to compute a residual-life distribution for the device being monitored, which can then be used in decision models. In this work, we develop Bayesian updating methods that use real-time condition monitoring information to update the stochastic parameters of exponential degradation models. We use these degradation models to develop a closed-form residual-life distribution for the monitored device. Finally, we apply these degradation...

Covariates and random effects in a gamma process model with application to degradation and failure.

Abstract: The gamma process is a natural model for degradation processes in which deterioration is supposed to take place gradually over time in a sequence of tiny increments. When units or individuals are observed over time it is often apparent that they degrade at different rates, even though no differences in treatment or environment are present. Thus, in applying gamma-process models to such data, it is necessary to allow for such unexplained differences. In the present paper this is accomplished by constructing a tractable gamma-process model incorporating a random effect. The model is fitted to some data on crack growth and corresponding goodness-of-fit tests are carried out. Prediction calculations for failure times defined in terms of degradation level passages are developed and illustrated.