W
William T. Estler
Researcher at National Institute of Standards and Technology
Publications - 28
Citations - 1281
William T. Estler is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: NIST & Measurement uncertainty. The author has an hindex of 13, co-authored 28 publications receiving 1081 citations.
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Journal ArticleDOI
Measurement technologies for precision positioning
Wei Gao,Seung-Woo Kim,Harald Bosse,Han Haitjema,Y.L. Chen,X.D. Lu,Wolfgang Knapp,Albert Weckenmann,William T. Estler,H. Kunzmann +9 more
TL;DR: In this paper, a review of measurement technologies for precision positioning in manufacturing industries is presented, followed by a discussion on traceability and standards, and some advanced applications of measurement technology for manufacturing industries.
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Large-Scale Metrology – An Update
TL;DR: A review of large-scale engineering metrology since the 1978 report of Puttock is given in this article, where techniques for high-accuracy straightness measurement, precision leveling and absolute distance metrology are described, together with approaches to compensation for the effects of atmospheric refraction.
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Advances in Large-Scale Metrology – Review and future trends
Robert Schmitt,Martin Peterek,E. Morse,Wolfgang Knapp,Maurizio Galetto,Frank Härtig,Gert Goch,Ben Richard Hughes,Alistair B. Forbes,William T. Estler +9 more
TL;DR: The field of large scale metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration as mentioned in this paper, which necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyberphysical systems.
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ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers.
Balasubramanian Muralikrishnan,Daniel S. Sawyer,Christopher J. Blackburn,Steven D. Phillips,Bruce R. Borchardt,William T. Estler +5 more
TL;DR: This paper presents some analysis, using error models and numerical simulation, of the sensitivity of the length measurement system tests and two-face system tests in the ASME B89.4.19 Standard to misalignments in laser trackers, and proposes new length measurements system tests that demonstrate improved sensitivity to some mis alignments.
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The estimation of measurement uncertainty of small circular features measured by coordinate measuring machines
TL;DR: In this article, the authors examined the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points, and showed that the uncertainty varies with the angular distribution of the measurement points.