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William T. Tucker

Researcher at General Electric

Publications -  21
Citations -  2145

William T. Tucker is an academic researcher from General Electric. The author has contributed to research in topics: Statistical process control & Process control. The author has an hindex of 9, co-authored 21 publications receiving 2127 citations.

Papers
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Journal ArticleDOI

Exponentially weighted moving average control schemes: properties and enhancements

TL;DR: In this article, the authors evaluate the properties of an exponentially weighted moving average (EWMA) control scheme used to monitor the mean of a normally distributed process that may experience shifts away from the target value.
Journal ArticleDOI

Algorithmic statistical process control: concepts and an application

TL;DR: This methodology seeks to exploit the strengths of both automatic control and statistical process control, two fields that have developed in relative isolation from one another.
Patent

System and method for automatically predicting the timing and costs of service events in a life cycle of a product

TL;DR: In this paper, a system and method for automatically predicting timing and costs of future service events in a life cycle of a product is presented, where a database contains a plurality of service information and performance information for the product.
Journal ArticleDOI

Identification of out of control quality characteristics in a multivariate manufacturing environment

TL;DR: In this article, the authors present an approach to help identify aberrant variables when Shewhart type variables are present in a process, rather than observing its various components separately, in order to identify which attributes are responsible for the deviation.
Journal ArticleDOI

Algorithmic Statistical Process Control: An Elaboration

TL;DR: A schema is presented for uniting traditional SPC and feedforward/feedback control into a system that exploits the strengths of both and discusses the theory and practice of such an approach, along with a consideration of research and technical issues that arise.