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Showing papers by "Xiaogang Liu published in 1996"


Journal ArticleDOI
Weisheng Hu1, Z.G. Liu1, Yan-Feng Chen1, Tao Yu1, H. W. Zhao1, Xiaobo Hu1, Xiaogang Liu1, R. X. Wu1 
TL;DR: In this paper, the authors used pulsed laser deposition technique to prepare piezoelectric/non-piezoeellectric multilayer films for microwave and supersonic wave propagation.
Abstract: Piezoelectric/nonpiezoelectric multilayer films were prepared by using pulsed laser deposition technique. The piezoelectric ZnO layers were completely (0001) textured and had the piezoelectric coefficient d33. The nonpiezoelectric (inactive) Al2O3 layers were amorphous and acted as good media for microwave and supersonic wave propagation. The periods were controlled by the deposition time in the range of 2.0 to 400 nm with the total period number of 4 to 30. In the multilayer films with ultrashort period of 2.1 nm, (0002) X-ray diffraction peak of ZnO layers was considerably broadened by the noncrystalline Al2O3 layers. In the multilayer films with short period of 6.4 nm, the diffraction peaks presented in small angle implies that the interfaces between layers were much flat and sharp, And in the multilayer films with long period, (0002) peak was very sharp, similar to the normal ZnO thin films. High frequency resonance was measured in the long-period multilayer films in the range of 1 - 20 GHz and higher frequency resonance is expected in the multilayer films with shorter period.

Journal ArticleDOI
TL;DR: In this article, a single-phase pseudo-cubic perovskite optical waveguiding thin film was prepared on SiO2-coated Si and on silica glass substrates by pulsed laser deposition.
Abstract: The ferroelectric (Pb, La) (Zr,Ti)O3 (PLZT(9.4/65/35)) optical waveguiding thin films have been prepared on SiO2 coated Si and on silica glass substrates by pulsed laser deposition. X-ray θ–2θ scans revealed that the films are single-phase pseudo-cubic perovskite. The surface chemical composition of the as grown films were determined by XPS. The ferroelectric properties of the films as grown on Pt/Ti coated silicon were demonstrated by using a modified Sawyer-Tower circuit, and the optical waveguiding properties of the films were characterized by using a rutile prism coupling method. The as grown films have an average transmittance of 80% in the wavelength range of 400≈2000nm and a refractive index of 2.2 at 632.8mn close to the bulk PLZT. The distinct m-lines of the guided TM and TE modes of the films as grown on SiO2 coated Si substrates have been observed.