scispace - formally typeset
Search or ask a question
Author

Y.-C. Chen

Bio: Y.-C. Chen is an academic researcher from Qimonda. The author has contributed to research in topics: Dielectrophoresis & Dynamic random-access memory. The author has an hindex of 2, co-authored 2 publications receiving 1224 citations.

Papers
More filters
Journal ArticleDOI
TL;DR: This work discusses the critical aspects that may affect the scaling of PCRAM, including materials properties, power consumption during programming and read operations, thermal cross-talk between memory cells, and failure mechanisms, and discusses experiments that directly address the scaling properties of the phase-change materials themselves.
Abstract: Nonvolatile RAM using resistance contrast in phase-change materials [or phase-change RAM (PCRAM)] is a promising technology for future storage-class memory. However, such a technology can succeed only if it can scale smaller in size, given the increasingly tiny memory cells that are projected for future technology nodes (i.e., generations). We first discuss the critical aspects that may affect the scaling of PCRAM, including materials properties, power consumption during programming and read operations, thermal cross-talk between memory cells, and failure mechanisms. We then discuss experiments that directly address the scaling properties of the phase-change materials themselves, including studies of phase transitions in both nanoparticles and ultrathin films as a function of particle size and film thickness. This work in materials directly motivated the successful creation of a series of prototype PCRAM devices, which have been fabricated and tested at phase-change material cross-sections with extremely small dimensions as low as 3 nm × 20 nm. These device measurements provide a clear demonstration of the excellent scaling potential offered by this technology, and they are also consistent with the scaling behavior predicted by extensive device simulations. Finally, we discuss issues of device integration and cell design, manufacturability, and reliability.

1,018 citations

Proceedings ArticleDOI
01 Dec 2007
TL;DR: Novel multi-level write algorithms for phase change memory which produce highly optimized resistance distributions in a minimum number of program cycles are discussed.
Abstract: We discuss novel multi-level write algorithms for phase change memory which produce highly optimized resistance distributions in a minimum number of program cycles. Using a novel integration scheme, a test array at 4 bits/cell and a 32 kb memory page at 2 bits/cell are experimentally demonstrated.

292 citations

Journal ArticleDOI
TL;DR: In this article , the authors presented a three-dimensional culture in a microfluidic device, where cancer cells were cultured in the center with GelMA (Gelatin methacryloyl) to mimic the tumor tissue, while micro channels were used to mimic immune cells in peripheral blood in this chip.
Abstract: Immunotherapy drugs have effects on the activity and efficacy of T cells in cancer therapy. However, the selection of personalized medicines in the clinic is difficult. Therefore, how to simplify the process is an important issue. This study presented a three-dimensional culture in a microfluidic device. Cancer cells were cultured in the center with GelMA (Gelatin methacryloyl) to mimic the tumor tissue, while microchannels were used to mimic immune cells in peripheral blood in this chip. The T-cell infiltration into the simulated tumor environment in the chip was observed by an imaging system. In addition, a reduction in the viability of cancer cells following T-cell infiltration was also observed. Moreover, the mortality rate of cancer cells increased after cancer cells were treated with atezolizumab or pembrolizumab. In conclusion, these results demonstrate the potential of our chip for cancer research and clinical drug efficacy.

Cited by
More filters
Journal ArticleDOI

[...]

08 Dec 2001-BMJ
TL;DR: There is, I think, something ethereal about i —the square root of minus one, which seems an odd beast at that time—an intruder hovering on the edge of reality.
Abstract: There is, I think, something ethereal about i —the square root of minus one. I remember first hearing about it at school. It seemed an odd beast at that time—an intruder hovering on the edge of reality. Usually familiarity dulls this sense of the bizarre, but in the case of i it was the reverse: over the years the sense of its surreal nature intensified. It seemed that it was impossible to write mathematics that described the real world in …

33,785 citations

Proceedings ArticleDOI
20 Jun 2009
TL;DR: This work proposes, crafted from a fundamental understanding of PCM technology parameters, area-neutral architectural enhancements that address these limitations and make PCM competitive with DRAM.
Abstract: Memory scaling is in jeopardy as charge storage and sensing mechanisms become less reliable for prevalent memory technologies, such as DRAM. In contrast, phase change memory (PCM) storage relies on scalable current and thermal mechanisms. To exploit PCM's scalability as a DRAM alternative, PCM must be architected to address relatively long latencies, high energy writes, and finite endurance.We propose, crafted from a fundamental understanding of PCM technology parameters, area-neutral architectural enhancements that address these limitations and make PCM competitive with DRAM. A baseline PCM system is 1.6x slower and requires 2.2x more energy than a DRAM system. Buffer reorganizations reduce this delay and energy gap to 1.2x and 1.0x, using narrow rows to mitigate write energy and multiple rows to improve locality and write coalescing. Partial writes enhance memory endurance, providing 5.6 years of lifetime. Process scaling will further reduce PCM energy costs and improve endurance.

1,568 citations

Journal ArticleDOI
20 Apr 2010
TL;DR: The physics behind this large resistivity contrast between the amorphous and crystalline states in phase change materials is presented and how it is being exploited to create high density PCM is described.
Abstract: In this paper, recent progress of phase change memory (PCM) is reviewed. The electrical and thermal properties of phase change materials are surveyed with a focus on the scalability of the materials and their impact on device design. Innovations in the device structure, memory cell selector, and strategies for achieving multibit operation and 3-D, multilayer high-density memory arrays are described. The scaling properties of PCM are illustrated with recent experimental results using special device test structures and novel material synthesis. Factors affecting the reliability of PCM are discussed.

1,488 citations

Proceedings ArticleDOI
20 Jun 2009
TL;DR: This paper analyzes a PCM-based hybrid main memory system using an architecture level model of PCM and proposes simple organizational and management solutions of the hybrid memory that reduces the write traffic to PCM, boosting its lifetime from 3 years to 9.7 years.
Abstract: The memory subsystem accounts for a significant cost and power budget of a computer system. Current DRAM-based main memory systems are starting to hit the power and cost limit. An alternative memory technology that uses resistance contrast in phase-change materials is being actively investigated in the circuits community. Phase Change Memory (PCM) devices offer more density relative to DRAM, and can help increase main memory capacity of future systems while remaining within the cost and power constraints.In this paper, we analyze a PCM-based hybrid main memory system using an architecture level model of PCM.We explore the trade-offs for a main memory system consisting of PCMstorage coupled with a small DRAM buffer. Such an architecture has the latency benefits of DRAM and the capacity benefits of PCM. Our evaluations for a baseline system of 16-cores with 8GB DRAM show that, on average, PCM can reduce page faults by 5X and provide a speedup of 3X. As PCM is projected to have limited write endurance, we also propose simple organizational and management solutions of the hybrid memory that reduces the write traffic to PCM, boosting its lifetime from 3 years to 9.7 years.

1,451 citations

Journal ArticleDOI
TL;DR: NVSim is developed, a circuit-level model for NVM performance, energy, and area estimation, which supports various NVM technologies, including STT-RAM, PCRAM, ReRAM, and legacy NAND Flash and is expected to help boost architecture-level NVM-related studies.
Abstract: Various new nonvolatile memory (NVM) technologies have emerged recently. Among all the investigated new NVM candidate technologies, spin-torque-transfer memory (STT-RAM, or MRAM), phase-change random-access memory (PCRAM), and resistive random-access memory (ReRAM) are regarded as the most promising candidates. As the ultimate goal of this NVM research is to deploy them into multiple levels in the memory hierarchy, it is necessary to explore the wide NVM design space and find the proper implementation at different memory hierarchy levels from highly latency-optimized caches to highly density- optimized secondary storage. While abundant tools are available as SRAM/DRAM design assistants, similar tools for NVM designs are currently missing. Thus, in this paper, we develop NVSim, a circuit-level model for NVM performance, energy, and area estimation, which supports various NVM technologies, including STT-RAM, PCRAM, ReRAM, and legacy NAND Flash. NVSim is successfully validated against industrial NVM prototypes, and it is expected to help boost architecture-level NVM-related studies.

1,100 citations