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Yosi Shacham-Diamand

Researcher at Tel Aviv University

Publications -  292
Citations -  6992

Yosi Shacham-Diamand is an academic researcher from Tel Aviv University. The author has contributed to research in topics: Thin film & Electrode. The author has an hindex of 42, co-authored 287 publications receiving 6463 citations. Previous affiliations of Yosi Shacham-Diamand include Technion – Israel Institute of Technology & Waseda University.

Papers
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Journal ArticleDOI

Engineered hybrid cardiac patches with multifunctional electronics for online monitoring and regulation of tissue function

TL;DR: An engineered cardiac patch is reported that integrates cardiac cells with flexible, free-standing electronics and a 3D nanocomposite scaffold that exhibited robust electronic properties, enabling the recording of cellular electrical activities and the on-demand provision of electrical stimulation for synchronizing cell contraction.
Patent

Electroless deposition of metal films with spray processor

TL;DR: In this article, a spray processor is used to form very thin metal films, such as 100 A, and these films have low resistivity values approaching bulk values, low surface roughness, excellent electrical and thickness uniformity and mirror-like surface.
Journal ArticleDOI

Electroless copper deposition for ULSI

TL;DR: In this article, the electroless copper deposition process as a metallization method for integrated circuit applications is discussed and two basic approaches are presented, planar and non-planar.
Journal ArticleDOI

Selective and Blanket Electroless Copper Deposition for Ultralarge Scale Integration

TL;DR: In this paper, a single-wafer electroless Cu deposition system with up to 8 in. wafer capability has been designed and manufactured, with high deposition rate (∼75 to 120 nm/min), with low resistivity (p < 2 μΩ cm), low surface roughness (R a ∼ 10 to 15 nm for ∼ 1.5 μm thick deposits) and good electrical uniformity (std dev <3% for 6 in.
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Copper transport in thermal SiO2

TL;DR: In this article, the penetration time for copper through the oxide was characterized as a function of temperature and applied electric field, and the role of a titanium layer between the copper and oxide was also studied.