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Author

Yu Bai

Bio: Yu Bai is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Convolutional neural network. The author has co-authored 1 publications.

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Proceedings ArticleDOI
18 Oct 2020
TL;DR: In this article, a new approach for agglomerates recognition in scanning electron microscopy (SEM) images of nanodielectrics by semantic segmentation algorithm is proposed.
Abstract: Agglomeration is a major challenge in the research of nanodielectrics. Recognition of agglomerates in scanning electron microscopy (SEM) images can effectively support tackle this issue. Motivated by the fast development of image recognition, we propose a new approach for agglomerates recognition in SEM images of nanodielectrics by semantic segmentation algorithm. On the basis of convolutional neural network, pixel blocks classification network and full convolutional segmentation network employed with data augmentation are investigated in this work. Both networks can preliminarily recognize the agglomerates of spherical silica-based blend polyethylene nanocomposites. The average intersection over union (mIoU) of the pixel blocks classification network is 0.837 and it takes 48 seconds to process an image, while the mIoU of the full convolutional segmentation network is 0.777 and it takes 0.059 seconds to process an image.