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Zhifeng Ren

Researcher at Texas Center for Superconductivity

Publications -  726
Citations -  84970

Zhifeng Ren is an academic researcher from Texas Center for Superconductivity. The author has contributed to research in topics: Thermoelectric effect & Thermoelectric materials. The author has an hindex of 122, co-authored 695 publications receiving 71212 citations. Previous affiliations of Zhifeng Ren include Massachusetts Institute of Technology & University of Cincinnati.

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Tellurium doped n-type Zintl Zr3Ni3Sb4 thermoelectric materials: Balance between carrier-scattering mechanism and bipolar effect

TL;DR: In this article, a relatively good ZT of ∼0.6 was achieved by Te doping on the Sb site, which can be attributed to the combination of high majority-carrier concentration and enlarged band gap.
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Mechanical properties of nanostructured thermoelectric materials α-MgAgSb

TL;DR: In this article, a detailed study on the mechanical properties of nanostructured α-MgAgSb is presented, where the Young's modulus, nanoindentation hardness, compressive strength, and fracture toughness are compared with other p-type thermoelectric materials.
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Theoretical studies on the thermoelectric figure of merit of nanograined bulk silicon

TL;DR: In this paper, the authors investigated the phonon transport in silicon nanocomposites using Monte Carlo simulations considering frequency-dependent phonon mean free paths, and combined the phonons modeling with electron modeling to predict the thermoelectric figure of merit (ZT) of silicon nano-composites.
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VS4 with a chain crystal structure used as an intercalation cathode for aqueous Zn-ion batteries

TL;DR: In this paper, vanadium tetrasulfide (VS4) with a beneficial one-dimensional atomic-chain structure is reported to serve as a favorable intercalation cathode material for high-performance Zn-ion batteries.
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A hot-wire probe for thermal measurements of nanowires and nanotubes inside a transmission electron microscope

TL;DR: A hot wire probe has been developed for use inside a transmission electron microscope to measure the thermal resistance of individual nanowires, nanotubes, and their contacts to minimize the effects of thermal expansion, intrinsic thermal vibrations, and Lorentz forces.