Showing papers presented at "AUTOTESTCON in 1998"

The fault recording and reporting method

Abstract: The patent-pending Fault Recording and Reporting Method uses a large amount of diverse information output from various line-replaceable units (LRUs) and other components of the aircraft during a mission through bulk storage on electronic media. After the aircraft lands, the electronic media are removed, accessed by an appropriate apparatus, and presented in a format that can be read with a personal computer (PC). This information provides the user, typically a service technician, with information relating to the aircraft's flight; specifically, various fault indications provided by LRUs and other components. From this information, the service technician can determine whether or not a fault indication recorded during the flight is a legitimate fault requiring removal of the affected LRU or component for further diagnostic testing. The method significantly reduces incidents of no-fault-found (NFF) diagnostic test results and saves labor hours that would otherwise be spent testing properly operating LRUs and components. The method minimizes on-aircraft data interpretations, rendering unnecessary on-board maintenance processors and technicians for LRU troubleshooting.

Multimedia-electronic technical manual for ATE

Abstract: This paper describes research related to the development of fast compression end playback routines for full screen, full motion color video and audio suitable for use on the IFTE Soldier Portable On-line Repair Tool (SPORT). This multimedia capability can be included as part of an interactive electronic technical manual (IETM). or incorporated into automatic test equipment (ATE) executive end test program set (TPS) application software. The technical innovations required to achieve the requisite high compression ratio while still preserving good image quality needed for use in ATE applications is described. The benefits or this capability for use in maintenance training, unit under test (UTT) setup and connection. And diagnostic procedures will also be discussed. In addition, we will describe methods that can be used to distribute and update multimedia sequences in deployed systems.

A virtual test-bench for analog circuit testability analysis and fault diagnosis

Abstract: Are fault simulation techniques feasible and effective for fault diagnosis of analog circuits? In this paper, we investigate these issues via a software tool which can generate testability metrics and diagnostic information for analog circuits represented by SPICE descriptions. This tool, termed the virtual test bench (VTB), incorporates three different simulation-based techniques for fault detection and isolation. The first method is based on the creation of fault-test dependency models, while the other two techniques employ machine learning principles based on the concepts of: (1) Restricted Coloumb Energy (RCE) Neural Networks, and (2) Learning Vector Quantization (LVQ). Whereas the output of the first method can be used for the traditional off-line diagnosis, the RCE and LVQ models render themselves more naturally to on-line monitoring, where measurement data from various sensors is continuously available. Since it is well known that analog faults and test measurements are affected by component parameter variations, we have also addressed the issues of robustness of our fault diagnosis schemes. Specifically, we have attempted to answer the questions regarding fixing of test measurement thresholds, obtaining the minimum number of Monte-Carlo runs required to stabilize the measurements and their deviations, and the effect of different thresholding schemes on the robustness of fault models. Although fault-simulation is a powerful technique for analog circuit testability analysis, its main shortcomings are the long simulation time, large volume of data and the fidelity of simulators in accurately modeling faults. We have plotted the simulation time and volume of data required for a range of circuit sizes to provide guidance on the feasibility and efficacy of this approach.

The IEEE 1073 Standard for Medical Device Communications

Abstract: The IEEE 1073 Standard for Medical Device Communications provides a new tool to healthcare providers looking to excel in the new competitive environment. Standardized data communications in life critical acute care situations enables new levels of systems performance for hospital information systems. New IT uses will require systems level validation similar to that already performed for avionics.

LCCA-life cycle cost analysis

Abstract: Quality and reliability are issues that are essential for commercial success. For many consumer products the reliability of semiconductor circuits is high enough to cover the lifetime of the system, which can be discarded when it fails. In other applications, e.g. in aircraft or military equipment, the situation is quite different-these systems tend to be more complex, consisting of a hierarchy from the basic components to the complete system. In addition, due to the long life-cycle, maintenance operations become a dominant cost factor. To be able to consider all costs from design and manufacturing to field service and thereby consider design effects on the life-cycle, an economic model is being developed with the intention of aiding designers and system developers to create a more cost-effective system.

Reducing the cost of test through reuse

Abstract: As the length of time between design and production decreases, the demand for timely and cost effective testing increases. One way to reduce the cost of test development is through the reuse of applications and components. This approach includes designing and implementing reusable components as well as leveraging off of existing tools and utilities. This paper describes a set of test applications that were designed for reuse and that, in turn, facilitate the creation of reusable components. These applications provide a common set of runtime services to a test system. In addition, their open architecture supports variety of test development environments and integration with third party or custom utilities. Descriptions of the applications are augmented by design discussions and implementation details.

A real-time multi-processing computer infrastructure for automated testing

Abstract: The modern test infrastructure utilizes multiple computers for data acquisition, embedded control and operator interface. Often these computers are integrated in a non-real-time communications network upon which system architects attempt to overlay real-time functionality. Under development at Ford is a deterministic, data-driven communications infrastructure employing reflective memory. This system is applicable to a wide range of test, simulation and local communication environments. Multiple computers of different design are made to function as a single multi-processing unit. Immediate application of this technology includes automated testing and powertrain calibration. This paper reviews the design requirements and describes the hardware/software architecture used to provide test site transparency, independent of computing platform and test system integrator.

Overview of ADSL test requirement towards conformance, performance and interoperability

Abstract: The enormous installed base of copper in the access network with the right transmission techniques present a huge potential for delivering broadband services to bandwidth hungry customers. Various Digital Subscriber line technologies (xDSL) employ various transmission methods and efficiently utilize the last available bandwidth on existing copper wires. Asymmetric Digital Subscriber Line (ADSL) delivers up to 6 Mbps to the user. This transmission of 6 Mbps is achieved using sophisticated modulation and compression techniques in a spectrum up to 1.1 MHz, pushing the physical limit on the usable bandwidth in the copper. This technology co-exists with impairments, noise intrusions, bridge taps, and other non-spectrally compatible transmissions. This paper presents an overview of xDSL Technology (which includes ADSL), the test challenges facing ADSL technology, and outlines the three areas of ADSL tests needed to ensure product conformance and cross vendor interoperability.

Next generation graphical development environment for test

Abstract: This paper discusses the client/server based Test Program Set (TPS) development environment that provides Automatic Test Equipment (ATE)/Unit Under Test (UUT) signal-based modeling coupled with a graphical programming environment. The model and programming information is stored in an SQL database with OLE DB connectivity. The ATE/UUT modeling defines the ATE capabilities and UUT signal requirements using a signal description methodology. This approach provides for a signal-based compatibility analysis to be performed and allows for asset matching to aid in ATE resource allocation by the engineer. The graphical development environment is a revolutionary new object-oriented approach to test program generation. It supports multi-language development including ATLAS dialects and National Instruments/sup TM/LabView/sup TM/ and LabWindows/sup TM//CVI compatible ANSI C within a single environment. It also provides support for end-user language customization and extension via ActiveX technology. The extendable syntax objects provide an iconic representation of the program structure and now. Define test implementations, variable declarations loop/branch constructs, function/procedure definitions and more. Code reusability is supported by the syntax objects via the syntax object library. With this multi-lingual graphical environment, a software framework is built instead of writing a linear text-based program. The program now is specified in a flowchart-like view of the test program where syntax icons are selected from a toolbox and are interconnected on a sequence line. This intuitive design platform frees the programmer from working out the many syntactical details of conventional programming. Because this environment dramatically reduces the time required to develop test programs, users experience a substantial productivity gain. This results from ease of use, as well as simplified code maintenance and reuse.

Smart repeater for radar testing

Abstract: One of the critical items in radar testing is the ability to perform an end-to-end test. This is frequently accomplished by the use of a standard target-a corner reflector or a repeater. In the case of a weapon location radar such as the European Counter (CO) Battery (B) Radar (RA) (COBRA) or the US AN/TPQ-36 and AN/TPQ-37, this is complicated by the desire to emulate the ballistic trajectory of a shell in flight. Technology Service Corporation (TSC) has developed a smart repeater that uses a long vertical antenna to simulate the vertical trajectory along with sophisticated software to represent the Doppler, range and amplitude changes during the flight. The most recent of these smart repeaters was developed for the COBRA system and is described in this paper.

Raytheon beta site evaluation of Teradyne's PC-based VXI functional test solution

Abstract: To keep pace with changing business conditions, Raytheon Systems Company has established a list of key objectives that refocus standards for high-speed, low-cost functional test. Raytheon's goal is to move toward modular, reconfigurable, PC-based, open-architecture automated test equipment that reduces overall program development and life-cycle costs. As part of a strategic alliance, Raytheon embarked on a Technical Interchange program with Teradyne and became a beta test site for the VECTOR/sup TM/ 9000-Series VXI Functional Test Platform. This paper describes how Raytheon's objectives were established and implemented, and the end goals met. It concludes with a review of the results of the strategic alliance and the beta site experience.

Automated fluorescent penetrant inspection (FPI) system is triple A

Abstract: This paper describes how Fluorescent Penetrant Inspection (FPI) was used in the past, how it is used now and how it will be used in the future. The United States Air Force (USAF) and Pratt & Whitney (P&W) now use a fully-automated FPI process with manual visual inspection. With direction and funding provided by the USAF/Aeronautical System Center (ASC), these fully-automated FPI processors, located at Kelly Air Force Base in San Antonio, Texas were developed, manufactured, installed qualified and put into operation by Pratt & Whitney. This paper will cover the following: the Qualification and Acceptance Tests which include test objectives, test articles, test facility, test equipment, test results, and training. This technology is affordable (lower processing cost resulting from increased throughput reduced maintenance man-hours and reduced material consumption), adaptable (multiple industry applications, flexible layout accommodates simple, complex, large and small geometries), and accurate (improved reliability and detection capability through consistent processing). In addition, the FPI system is environmentally clean. P&W can design, manufacture, and install a customized FPI system for its customers. P&W is continually improving today's technologies and techniques to assure global readiness for the 21st century.

Automatic BIST design tool for mixed-signal circuits

Abstract: This paper describes the development of a software tool for automating the design process of built-in self-test (BIST) circuits for mixed-signal circuit cards. The purpose of this tool is to generate a complete design of microcontroller-based BIST circuits including hardware and firmware. A typical BIST system generated by this tool consists of a microcontroller, A/D, D/A converters, digital I/Os, digital/analog multiplexers, and a programmable logic device. Several heuristic-based algorithms were developed in this work to optimize the configuration of multiplexers so that the required number of input and output ports is minimized, and the size and number of multiplexers are also reduced. The design tool reported here can greatly simplify the time-consuming procedure of designing BIST circuits and optimize the BIST circuits for mixed-signal circuit cards. A demonstration board is currently under development to evaluate the usability of this tool. The paper focuses on the overall theory and application of the tool, and also describes how if interfaces to the larger tool set we have developed. This larger tool set includes tools to help the designer define the level of built-in test required to meet the system maintainability goals.

Road profile control methods for laboratory vehicle road simulators

Abstract: The use of laboratory road simulators has become quite common in the automotive industry. Although laboratory road simulators have reduced testing time, two obstacles to improving process automation remain. First, since traditional simulation control parameters are specimen dependent, new data must be acquired for each specimen to ensure accurate test results, significantly adding to the time and cost of the testing process. The second impediment is that current simulator control is achieved using an open-loop iterative process, which is time consuming, requires a skilled test engineer, and cannot account for changes in the test vehicle's parameters due to design evolution or suspension degradation as the durability test proceeds. This paper will demonstrate two major process improvements in road simulator control. The first is a method to reduce the need for new data to be acquired to account for vehicle configuration changes. This will be accomplished by including a model of missing dynamics, specifically the tire, in the control loop to enable road-profile simulation control. The second improvement involves the demonstration of an improved on-line control process using an H-infinity approach that allows for frequency dependent weightings to represent sensor noise W/sub n/, and model uncertainty W/sub u/. Performance will be specified by the weighting W/sub e/.

Testing requirements for microelectromechanical systems (MEMS)

Abstract: This presentation addresses some of these challenges and outlines potential approaches to overcoming them. Examples of the many energy domains encountered in MEMS devices will be provided and potential strategies for evaluating MEMS device performance in these domains will be discussed. Particular attention will be paid to the challenges of measuring performance of these devices in an extensively integrated MEMS device. High-volume fabrication of MEMS devices based on lithographic methods leads to large data sets and generally predictable, but extensive, variations in fabricated tolerances. Potential methods of addressing these challenges will be described and compared with similar approaches used in integrated circuit testing. The small size of MEMS devices also poses challenges for tests that are influenced by material parameters that are not well understood at the micron scale. Interfaces and surfaces that are a relatively unimportant at the scale of macro-devices can dominate performance of MEMS devices. In addition, critical material variations (crystalline structure, strength, etc.) that can be integrated over large volumes in macro-applications must be treated exactly for many MEMS devices. The influence of these challenges on testing of MEMS devices will be discussed and approaches to address these challenges are described.

Innovations in infrared scene simulator design

Abstract: The MIRAGE (Multispectral Infrared Animation Generation Equipment) Dynamic Infrared Scene Projector, is a joint project developed by Santa Barbara Infrared Inc. and Indigo Systems Corporation. MIRAGE is a complete infrared scene projector, accepting 3-D rendered analog or digital scene data at its input, and providing all other electronics, collimated optics, calibration and thermal support subsystems needed to stimulated a unit under test with high-fidelity, dynamic infrared scenes. At the heart of MIRAGE is a 512/spl times/512 emitter array, with key innovations that solve several problems of existing designs. The read-in integrated circuit (RIIC) features "snapshot" updating of the entire 512/spl times/512 resistive array, thus solving synchronization and latency problems inherent in "rolling-update" type designs, where date is always changing somewhere on the emitter array at any given time. This custom mixed-signal RIIC also accepts digital scene information at its input, and uses on-board D/A converters and individual unit-cell buffer amplifiers to create analog scene levels, eliminating the complexity noise, and limitations of speed and dynamic range associated with external generation of analog scene levels. The proprietary process used to create the advanced technology micro-membrane emitter elements allows a wide choice of resistor and structure materials while preserving the dissipation and providing a thermal time constant of the order of 5 ms.

The hidden crisis in test effectiveness

Abstract: The sophistication and complexity of avionic, and other, prime systems has been growing at a pace that has not been matched by commensurate improvements in test technology. The result is NFF (no fault found) and other test effectiveness deficiencies that will soon, if they have not already, reach crisis levels. This pending crisis is all the more serious because it tends to be hidden by a variety of technical, administrative and commercial factors that often mask the real problems, and that sometimes even hinder the measures needed to correct them. Corrective action requires recognition of the true nature of test effectiveness deficiencies, the paradigms and processes with which they are associated, and the changes required to keep pace with modern prime system technology, maintenance requirements and safety objectives.

Optimizing the use of component-level BIT in system-level test and diagnosis: a consistent diagnostic information architecture approach

Abstract: The need to improve system-level test and diagnosis is particularly crucial in today's environment in which the service lives of systems are being extended, making the reduction of operation and support (O&S) costs more imperative. Component-level built-in-test (BIT) represents a potentially significant contributor to this process. Unfortunately, there are both significant challenges associated with effectively using component-level BIT information in system-level test and diagnostic implementations as well as shortfalls in the overall performance of elements of the integrated diagnostic process. Research conducted as part of the Open Systems Approach to Integrated Diagnostics Demonstration (OSAIDD) program has shown that these shortfalls have been evident in products from both the public and private sectors. System integrators and acquisition managers of commercial and military products would greatly benefit from a consistent approach to the design and implementation of a system's diagnostic capability within which the use of component-level BIT could be improved. This paper proposes a consistent, information-based architecture as an extensible solution to address this deficiency. The extensibility of this architecture will be highlighted by showing its applicability to both new development and legacy systems.

Portable maintenance aid instrument pack (PIP)

Abstract: Flight line component false removals are costly and add to the logistics tail of every weapon system. VXI offers opportunity to consolidate test needs into a user-friendly application that can significantly reduce flight line false removal rates. VXI has grown substantially in applications from testing in the lab to field support of weapon systems. Early criticism of VXI came that it was only intended for lab or depot environments. Recently, developers have been taking on the challenge of extending VXI use into field environments. This paper addresses false removals, describes a VXI test system approach, and describes the challenges of creating an enclosure for COTS VXI instruments that protect them from very harsh flight-line environmental extremes. This effort was accomplished for the RAH-66 Comanche Helicopter program, and has created two working prototypes.

Blending borescope inspection (BBI) maintenance service equates to cost savings

Abstract: This paper provides an insight into how the introduction and implementation of the blending borescope used to perform on-wing blending of compressor blades on Pratt & Whitney (PW military statistics and potential savings; the PW what is on-wing blending; the capabilities of on-wing blending; a description of the contents of a typical blending borescope inspection kit; test results; measurement of Foreign Objects Damage (FOD); installation of the equipment; how to measure the repair and observe how the equipment provides precise results; how to polish the repair. Typical commercial cost savings for blending assembled compressors are in the order of $360,000.00 per event, compared with engine teardown cost. P&W provides 24 hour, hassle-free blending borescope on-wing maintenance service to commercial customers worldwide, and proposes to provide the same service to P&W's military customers worldwide.

Using commercial off-the-shelf (COTS) equipment to meet joint service requirements

Abstract: This paper offers guidance in utilizing commercial off-the-shelf (COTS) electronics hardware to meet critical requirements of the joint services. The common munitions BIT/reprogramming equipment (CMBRE) program utilized COTS hardware to initiate BIT and reprogram smart munitions in the extreme environments of the Air Force/Navy flight lines. The CMBRE program benefited from the use of COTS in many areas such as cost, schedule and performance. This paper provides a contractor's view of how to successfully utilize COTS hardware and share in the benefits COTS provides.

Testing of MEMS material properties and stability

Abstract: This article presents progress in characterizing MEMS failure. The results are applicable to a wide range of materials and applications. Data is presented, however, for MEMS polysilicon and single crystal silicon. The observations of fatigue crack growth in single crystal silicon and time dependent crack initiation in polysilicon are important because they indicate MEMS failure modes that have not been previously recognized. The effects of microstructure, environment, and fabrication can become significant on the micro scale even when they are irrelevant in larger, macroscale structures. The microstructure of MEMS devices is also different from that of large bodies of the same material.

Building hardware-independent test systems with IVI

Abstract: Interchangeable Virtual Instrument (IVI) drivers are an exciting new technology that enables test engineers to reuse their test programs with different instruments. IVI drivers are based on VXIplug&play technology, so users of LabVIEW, LabWindows/CVI, Visual Basic, Visual C++, and any other programming environments capable of calling DLL-based VXIplug&play-style drivers can use IVI drivers. This paper outlines the theory, tools, and mechanisms involved in using these tools to build a hardware-independent test system.

A new dependency model based testability analyzer

Abstract: This paper describes the development of a testability analysis tool called ADMA. The approach used in ADMA is based on use of dependency models. Dependency models are the basis of several important products for testability analysis. What makes ADMA different from existing testability analysis tools is its capability to use multiple analysis algorithms and its user-friendly report format. The rationale behind the decision to support multiple algorithms is that an algorithm may perform better for certain circuits than other algorithms ADMA allows users to compare the results of different analysis side by side. ADMA provides concise reports of different formats for different types of users, such as executives, system designers, test engineers, and dependency modelers. Thus, users can focus on the aspects that are of interest to them. The subject paper gives an overview of the ADMA, emphasizing the fundamental advances represented by ADMA. The paper also describes how this tool integrates with the Automatic Dependency Model Generator, and with the Automatic Built-in Test generator. The paper does not focus on ADMA as a product, but more on how it generally extends current dependency mode-based tools.

Application of real-time simulation for test

Abstract: In-circuit testing is a mature technology, yet it has compromising issues. One issue is the application of device test programs from a program library. These programs are viable for testing components in free air, but adjustments are often required when applying these tests to a device on a populated circuit board. Such test modification, such as test pruning and arbitrary masking, frequently reduces the quality of test. One way to resolve this shortcoming is through the use of a real-time software reference model. During testing, the software model receives information about device interconnections and tied pins. The test software then runs the device test program against both the software model and the actual device. The software model results are then compared to the device measured results to determine if the test passed or failed. The key advantage of this technique is that component testing may be performed in-circuit without knowledge of how the device is connected in the circuit. This is extremely useful for testing assemblies that have little or no support documentation. This paper describes the technical details of this approach, its implementation in a test instrument and the results of its application.

Challenges of MEMS device characterization in engineering development and final manufacturing

Abstract: Testing of microelectromechanical systems (MEMS) devices is rapidly progressing to the point that high volume, cost effective, and accurate measurement systems are necessary. This area of automatic test is very challenging compared to a normal semiconductor portfolio. Besides the typical electrical and thermal stimulus, a MEMS measurement system requires control of the quantity, property, or condition to be measured. Information on MEMS related testing issue including input stimuli and output responses are presented. A definition for a MEMS characterization system is proposed. Additionally, future demands based on a expanding product portfolio are discussed.

Testing tomorrow's fire control systems today

Abstract: Military Electro-Optic fire control systems have evolved greatly over the years and continue to do so. The pace of evolution has sped up, due to the lower cost of purchasing upgraded sensor systems vs. the higher cost of buying all new tanks, ships, or aircraft. The evolution of fire control systems themselves drive a required evolution to their optical test systems, which must have a 4/spl times/ to 10/spl times/ greater precision. The newest fire control systems, many still in the drawing stages, have 2/sup nd/ and 3/sup rd/ generation FLIRs/DLIRs, coaxial FLIR/laser systems, as well as much improved laser rangefinder/designator systems. Additionally, many of the newer systems are going to EYESAFE laser wavelengths which carry another set of requirements. This paper discusses the requirements for testing current and future systems. We shall show the paradigm shift required for such testing and a production E-O test system which is already testing some of tomorrow's fire control systems today.

Thermal energy emission diagnostics enhancement to the advanced power supply test system

Abstract: The Advanced Power Supply Test Station (APSTS) is a system used for automated power supply testing. The capabilities of this system have been enhanced by the development and integration of a Thermal Diagnostic Instrument to provide thermal energy emission diagnostics. Thermal images of a power supply circuit board are acquired at intervals during initial power-on. A projective mapping technique based on geometric image warping is used to locate individual components in these images given arbitrary alignment between the board and the imager. A unique energy ratio calculation is used to normalize the effects of emissivity in the measured thermal values for each component. A fuzzy logic expert system and an artificial neural network are used to compute likelihood of failure estimates from these energy ratio values. Fuzzy logic membership functions are based on experimental data from normal and failed circuit boards, and rules are based on the knowledge of the board circuits.

VSI plug 'n pray

Abstract: VXI has grown substantially in applications from testing in the lab to field support of weapon systems. While the hardware interfaces have been well defined for some time, the software is still struggling. Industry hype infers that integrating VXI resources is just a "plug and play" affair that anyone should be able to do. This paper explores some of the pitfalls of integrating VXI resources from different (and sometimes the same) suppliers that make this more of a challenge than you might think.

C-17 portable advanced diagnostic system

Abstract: The issue of Can Not Duplicate and Re-Test OK (CND/RTOK) for aircraft systems is one that has troubled the USAF for many years. This problem is being exacerbated by the increasing complexity of military avionics systems. The impact of these unnecessary line replaceable unit (LRU) removals is an increased burden on the USAF supply and maintenance system. Boeing Airlift and Tanker Programs is developing the Portable Advanced Diagnostics System (PADS) to both reduce CND/RTOK on the fielded C-17 A aircraft and aid in production integration and test. PADS is a software application that performs the following functions: 1) augments the aircraft on-board fault isolation capability to preclude the unnecessary removal of good LRUs; 2) correlates LRU reported faults, crew and maintainer observations, and aircraft fault history to disposition faults that can not be duplicated. The results of PADS implementation will be: (1) improved mission effectiveness; (2) reduced life cycle cost and maintenance man-hours per flight hour; (3) decreased aircraft turnaround time; and (4) decreased production costs.