Example of Microelectronics Reliability format
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Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format
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Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format Example of Microelectronics Reliability format
Sample paper formatted on SciSpace - SciSpace
This content is only for preview purposes. The original open access content can be found here.
open access Open Access

Microelectronics Reliability — Template for authors

Publisher: Elsevier
Categories Rank Trend in last 3 yrs
Safety, Risk, Reliability and Quality #52 of 165 down down by 8 ranks
Surfaces, Coatings and Films #42 of 123 up up by 2 ranks
Electrical and Electronic Engineering #261 of 693 down down by 18 ranks
Condensed Matter Physics #164 of 411 up up by 11 ranks
Atomic and Molecular Physics, and Optics #78 of 192 down down by 2 ranks
Electronic, Optical and Magnetic Materials #105 of 246 down down by 8 ranks
journal-quality-icon Journal quality:
Good
calendar-icon Last 4 years overview: 1588 Published Papers | 5684 Citations
indexed-in-icon Indexed in: Scopus
last-updated-icon Last updated: 04/06/2020
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Related Journals

open access Open Access

Elsevier

Quality:  
Good
CiteRatio: 3.0
SJR: 0.289
SNIP: 0.903
open access Open Access

Elsevier

Quality:  
Good
CiteRatio: 4.5
SJR: 0.553
SNIP: 0.915
open access Open Access

Elsevier

Quality:  
Good
CiteRatio: 3.7
SJR: 0.465
SNIP: 0.979
open access Open Access

Wiley

Quality:  
Good
CiteRatio: 2.7
SJR: 0.304
SNIP: 0.616

Journal Performance & Insights

CiteRatio

SCImago Journal Rank (SJR)

Source Normalized Impact per Paper (SNIP)

A measure of average citations received per peer-reviewed paper published in the journal.

Measures weighted citations received by the journal. Citation weighting depends on the categories and prestige of the citing journal.

Measures actual citations received relative to citations expected for the journal's category.

3.6

16% from 2019

CiteRatio for Microelectronics Reliability from 2016 - 2020
Year Value
2020 3.6
2019 3.1
2018 2.6
2017 2.6
2016 2.6
graph view Graph view
table view Table view

0.445

10% from 2019

SJR for Microelectronics Reliability from 2016 - 2020
Year Value
2020 0.445
2019 0.497
2018 0.376
2017 0.388
2016 0.447
graph view Graph view
table view Table view

0.981

2% from 2019

SNIP for Microelectronics Reliability from 2016 - 2020
Year Value
2020 0.981
2019 0.964
2018 1.017
2017 0.913
2016 0.988
graph view Graph view
table view Table view

insights Insights

  • CiteRatio of this journal has increased by 16% in last years.
  • This journal’s CiteRatio is in the top 10 percentile category.

insights Insights

  • SJR of this journal has decreased by 10% in last years.
  • This journal’s SJR is in the top 10 percentile category.

insights Insights

  • SNIP of this journal has increased by 2% in last years.
  • This journal’s SNIP is in the top 10 percentile category.

Microelectronics Reliability

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Elsevier

Microelectronics Reliability

Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and p...... Read More

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Last updated on
04 Jun 2020
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ISSN
0026-2714
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Impact Factor
High - 1.308
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Open Access
No
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Sherpa RoMEO Archiving Policy
Green faq
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Plagiarism Check
Available via Turnitin
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Endnote Style
Download Available
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Bibliography Name
elsarticle-num
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Citation Type
Numbered
[25]
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Bibliography Example
G. E. Blonder, M. Tinkham, T. M. Klapwijk, Transition from metallic to tunneling regimes in superconducting microconstrictions: Excess current, charge imbalance, and supercurrent conversion, Phys. Rev. B 25 (7) (1982) 4515–4532. URL 10.1103/PhysRevB.25.4515

Top papers written in this journal

Journal Article DOI: 10.1016/S0026-2714(02)00042-2
Selected failure mechanisms of modern power modules
Mauro Ciappa1

Topics:

Power module (50%)50% related to the paper
View PDF
862 Citations
Journal Article DOI: 10.1016/S0026-2714(02)00027-6
A review of recent MOSFET threshold voltage extraction methods
Adelmo Ortiz-Conde1, F. García Sánchez1, Juin J. Liou2, Antonio Cerdeira3, Magali Estrada3, Y. Yue4

Topics:

Subthreshold conduction (63%)63% related to the paper, Overdrive voltage (62%)62% related to the paper, Threshold voltage (60%)60% related to the paper, MOSFET (55%)55% related to the paper, Capacitance (52%)52% related to the paper
813 Citations
Journal Article DOI: 10.1016/J.MICROREL.2010.09.031
Reliability challenges in 3D IC packaging technology
King-Ning Tu1

Topics:

Reliability (semiconductor) (53%)53% related to the paper, Packaging engineering (52%)52% related to the paper, Flip chip (52%)52% related to the paper, Three-dimensional integrated circuit (50%)50% related to the paper
493 Citations
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SciSpace is a very innovative solution to the formatting problem and existing providers, such as Mendeley or Word did not really evolve in recent years.

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Time taken to format a paper and Compliance with guidelines

Plagiarism Reports via Turnitin

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Microelectronics Reliability format uses elsarticle-num citation style.

Automatically format and order your citations and bibliography in a click.

SciSpace allows imports from all reference managers like Mendeley, Zotero, Endnote, Google Scholar etc.

Frequently asked questions

1. Can I write Microelectronics Reliability in LaTeX?

Absolutely not! Our tool has been designed to help you focus on writing. You can write your entire paper as per the Microelectronics Reliability guidelines and auto format it.

2. Do you follow the Microelectronics Reliability guidelines?

Yes, the template is compliant with the Microelectronics Reliability guidelines. Our experts at SciSpace ensure that. If there are any changes to the journal's guidelines, we'll change our algorithm accordingly.

3. Can I cite my article in multiple styles in Microelectronics Reliability?

Of course! We support all the top citation styles, such as APA style, MLA style, Vancouver style, Harvard style, and Chicago style. For example, when you write your paper and hit autoformat, our system will automatically update your article as per the Microelectronics Reliability citation style.

4. Can I use the Microelectronics Reliability templates for free?

Sign up for our free trial, and you'll be able to use all our features for seven days. You'll see how helpful they are and how inexpensive they are compared to other options, Especially for Microelectronics Reliability.

5. Can I use a manuscript in Microelectronics Reliability that I have written in MS Word?

Yes. You can choose the right template, copy-paste the contents from the word document, and click on auto-format. Once you're done, you'll have a publish-ready paper Microelectronics Reliability that you can download at the end.

6. How long does it usually take you to format my papers in Microelectronics Reliability?

It only takes a matter of seconds to edit your manuscript. Besides that, our intuitive editor saves you from writing and formatting it in Microelectronics Reliability.

7. Where can I find the template for the Microelectronics Reliability?

It is possible to find the Word template for any journal on Google. However, why use a template when you can write your entire manuscript on SciSpace , auto format it as per Microelectronics Reliability's guidelines and download the same in Word, PDF and LaTeX formats? Give us a try!.

8. Can I reformat my paper to fit the Microelectronics Reliability's guidelines?

Of course! You can do this using our intuitive editor. It's very easy. If you need help, our support team is always ready to assist you.

9. Microelectronics Reliability an online tool or is there a desktop version?

SciSpace's Microelectronics Reliability is currently available as an online tool. We're developing a desktop version, too. You can request (or upvote) any features that you think would be helpful for you and other researchers in the "feature request" section of your account once you've signed up with us.

10. I cannot find my template in your gallery. Can you create it for me like Microelectronics Reliability?

Sure. You can request any template and we'll have it setup within a few days. You can find the request box in Journal Gallery on the right side bar under the heading, "Couldn't find the format you were looking for like Microelectronics Reliability?”

11. What is the output that I would get after using Microelectronics Reliability?

After writing your paper autoformatting in Microelectronics Reliability, you can download it in multiple formats, viz., PDF, Docx, and LaTeX.

12. Is Microelectronics Reliability's impact factor high enough that I should try publishing my article there?

To be honest, the answer is no. The impact factor is one of the many elements that determine the quality of a journal. Few of these factors include review board, rejection rates, frequency of inclusion in indexes, and Eigenfactor. You need to assess all these factors before you make your final call.

13. What is Sherpa RoMEO Archiving Policy for Microelectronics Reliability?

SHERPA/RoMEO Database

We extracted this data from Sherpa Romeo to help researchers understand the access level of this journal in accordance with the Sherpa Romeo Archiving Policy for Microelectronics Reliability. The table below indicates the level of access a journal has as per Sherpa Romeo's archiving policy.

RoMEO Colour Archiving policy
Green Can archive pre-print and post-print or publisher's version/PDF
Blue Can archive post-print (ie final draft post-refereeing) or publisher's version/PDF
Yellow Can archive pre-print (ie pre-refereeing)
White Archiving not formally supported
FYI:
  1. Pre-prints as being the version of the paper before peer review and
  2. Post-prints as being the version of the paper after peer-review, with revisions having been made.

14. What are the most common citation types In Microelectronics Reliability?

The 5 most common citation types in order of usage for Microelectronics Reliability are:.

S. No. Citation Style Type
1. Author Year
2. Numbered
3. Numbered (Superscripted)
4. Author Year (Cited Pages)
5. Footnote

15. How do I submit my article to the Microelectronics Reliability?

It is possible to find the Word template for any journal on Google. However, why use a template when you can write your entire manuscript on SciSpace , auto format it as per Microelectronics Reliability's guidelines and download the same in Word, PDF and LaTeX formats? Give us a try!.

16. Can I download Microelectronics Reliability in Endnote format?

Yes, SciSpace provides this functionality. After signing up, you would need to import your existing references from Word or Bib file to SciSpace. Then SciSpace would allow you to download your references in Microelectronics Reliability Endnote style according to Elsevier guidelines.

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I spent hours with MS word for reformatting. It was frustrating - plain and simple. With SciSpace, I can draft my manuscripts and once it is finished I can just submit. In case, I have to submit to another journal it is really just a button click instead of an afternoon of reformatting.

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