Example of Advanced Structural and Chemical Imaging format
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Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format
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open access Open Access
recommended Recommended

Advanced Structural and Chemical Imaging — Template for authors

Publisher: Springer
Categories Rank Trend in last 3 yrs
Radiology, Nuclear Medicine and Imaging #10 of 288 down down by None rank
Spectroscopy #5 of 74 down down by None rank
Chemical Engineering (miscellaneous) #5 of 27 down down by None rank
journal-quality-icon Journal quality:
High
calendar-icon Last 4 years overview: 35 Published Papers | 325 Citations
indexed-in-icon Indexed in: Scopus
last-updated-icon Last updated: 05/07/2020
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Related Journals

open access Open Access
recommended Recommended

Elsevier

Quality:  
High
CiteRatio: 13.6
SJR: 1.634
SNIP: 1.934
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Wiley

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SJR: 1.278
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Journal Performance & Insights

CiteRatio

SCImago Journal Rank (SJR)

Source Normalized Impact per Paper (SNIP)

A measure of average citations received per peer-reviewed paper published in the journal.

Measures weighted citations received by the journal. Citation weighting depends on the categories and prestige of the citing journal.

Measures actual citations received relative to citations expected for the journal's category.

9.3

63% from 2019

CiteRatio for Advanced Structural and Chemical Imaging from 2016 - 2020
Year Value
2020 9.3
2019 5.7
2018 0.8
graph view Graph view
table view Table view

2.628

90% from 2019

SJR for Advanced Structural and Chemical Imaging from 2019 - 2020
Year Value
2020 2.628
2019 1.385
graph view Graph view
table view Table view

2.366

114% from 2019

SNIP for Advanced Structural and Chemical Imaging from 2018 - 2020
Year Value
2020 2.366
2019 1.107
2018 1.145
graph view Graph view
table view Table view

insights Insights

  • CiteRatio of this journal has increased by 63% in last years.
  • This journal’s CiteRatio is in the top 10 percentile category.

insights Insights

  • SJR of this journal has increased by 90% in last years.
  • This journal’s SJR is in the top 10 percentile category.

insights Insights

  • SNIP of this journal has increased by 114% in last years.
  • This journal’s SNIP is in the top 10 percentile category.

Advanced Structural and Chemical Imaging

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Springer

Advanced Structural and Chemical Imaging

Approved by publishing and review experts on SciSpace, this template is built as per for Advanced Structural and Chemical Imaging formatting guidelines as mentioned in Springer author instructions. The current version was created on and has been used by 713 authors to write and format their manuscripts to this journal.

Dynamic imaging

i
Last updated on
05 Jul 2020
i
ISSN
1606-8610
i
Open Access
Yes
i
Sherpa RoMEO Archiving Policy
White faq
i
Plagiarism Check
Available via Turnitin
i
Endnote Style
Download Available
i
Citation Type
Author Year
(Blonder et al, 1982)
i
Bibliography Example
Beenakker CWJ (2006) Specular andreev reflection in graphene. Phys Rev Lett 97(6):067,007, URL 10.1103/PhysRevLett.97.067007

Top papers written in this journal

open accessOpen access Journal Article DOI: 10.1186/S40679-015-0008-4
Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Abstract:

Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning t... Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias-voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated. read more read less

Topics:

Microscope (57%)57% related to the paper, Optical sectioning (56%)56% related to the paper, Image registration (53%)53% related to the paper
View PDF
331 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-017-0042-5
Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting.
Magnus Nord1, Per Erik Vullum1, Per Erik Vullum2, Ian MacLaren3, Thomas Tybell1, Randi Holmestad1

Abstract:

Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different... Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different elements. In this work, we present a free and open source software tool for analysing both the position and shapes of atomic columns in STEM-images, using 2-D elliptical Gaussian distributions. The software is tested on variants of the perovskite oxide structure. By first fitting the most intense atomic columns and then subtracting them, information on all the projected sublattices can be obtained. From this, we can extract changes in the lattice parameters and shape of A-cation columns from annular dark field images of perovskite oxide heterostructures. Using annular bright field images, shifts in oxygen column positions are also quantified in the same heterostructure. The precision of determining the position of atomic columns is compared between STEM data acquired using standard acquisition, and STEM-images obtained as an image stack averaged after using non-rigid registration. read more read less

Topics:

Dark field microscopy (51%)51% related to the paper
View PDF
173 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-017-0046-1
A fast image simulation algorithm for scanning transmission electron microscopy.
Colin Ophus1

Abstract:

Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave ... Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor f that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with f 4 compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate. read more read less

Topics:

Scanning confocal electron microscopy (63%)63% related to the paper, Electron tomography (59%)59% related to the paper, Energy filtered transmission electron microscopy (57%)57% related to the paper, Conventional transmission electron microscope (57%)57% related to the paper, Prism (57%)57% related to the paper
View PDF
145 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-016-0036-8
SYRMEP Tomo Project: a graphical user interface for customizing CT reconstruction workflows.

Abstract:

When considering the acquisition of experimental synchrotron radiation (SR) X-ray CT data, the reconstruction workflow cannot be limited to the essential computational steps of flat fielding and filtered back projection (FBP). More refined image processing is often required, usually to compensate artifacts and enhance the qua... When considering the acquisition of experimental synchrotron radiation (SR) X-ray CT data, the reconstruction workflow cannot be limited to the essential computational steps of flat fielding and filtered back projection (FBP). More refined image processing is often required, usually to compensate artifacts and enhance the quality of the reconstructed images. In principle, it would be desirable to optimize the reconstruction workflow at the facility during the experiment (beamtime). However, several practical factors affect the image reconstruction part of the experiment and users are likely to conclude the beamtime with sub-optimal reconstructed images. Through an example of application, this article presents SYRMEP Tomo Project (STP), an open-source software tool conceived to let users design custom CT reconstruction workflows. STP has been designed for post-beamtime (off-line use) and for a new reconstruction of past archived data at user’s home institution where simple computing resources are available. Releases of the software can be downloaded at the Elettra Scientific Computing group GitHub repository https://github.com/ElettraSciComp/STP-Gui . read more read less

Topics:

Iterative reconstruction (54%)54% related to the paper
View PDF
103 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-015-0006-6
Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets.

Abstract:

The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, ... The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information. read more read less

Topics:

Data analysis (51%)51% related to the paper
View PDF
101 Citations
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Frequently asked questions

1. Can I write Advanced Structural and Chemical Imaging in LaTeX?

Absolutely not! Our tool has been designed to help you focus on writing. You can write your entire paper as per the Advanced Structural and Chemical Imaging guidelines and auto format it.

2. Do you follow the Advanced Structural and Chemical Imaging guidelines?

Yes, the template is compliant with the Advanced Structural and Chemical Imaging guidelines. Our experts at SciSpace ensure that. If there are any changes to the journal's guidelines, we'll change our algorithm accordingly.

3. Can I cite my article in multiple styles in Advanced Structural and Chemical Imaging?

Of course! We support all the top citation styles, such as APA style, MLA style, Vancouver style, Harvard style, and Chicago style. For example, when you write your paper and hit autoformat, our system will automatically update your article as per the Advanced Structural and Chemical Imaging citation style.

4. Can I use the Advanced Structural and Chemical Imaging templates for free?

Sign up for our free trial, and you'll be able to use all our features for seven days. You'll see how helpful they are and how inexpensive they are compared to other options, Especially for Advanced Structural and Chemical Imaging.

5. Can I use a manuscript in Advanced Structural and Chemical Imaging that I have written in MS Word?

Yes. You can choose the right template, copy-paste the contents from the word document, and click on auto-format. Once you're done, you'll have a publish-ready paper Advanced Structural and Chemical Imaging that you can download at the end.

6. How long does it usually take you to format my papers in Advanced Structural and Chemical Imaging?

It only takes a matter of seconds to edit your manuscript. Besides that, our intuitive editor saves you from writing and formatting it in Advanced Structural and Chemical Imaging.

7. Where can I find the template for the Advanced Structural and Chemical Imaging?

It is possible to find the Word template for any journal on Google. However, why use a template when you can write your entire manuscript on SciSpace , auto format it as per Advanced Structural and Chemical Imaging's guidelines and download the same in Word, PDF and LaTeX formats? Give us a try!.

8. Can I reformat my paper to fit the Advanced Structural and Chemical Imaging's guidelines?

Of course! You can do this using our intuitive editor. It's very easy. If you need help, our support team is always ready to assist you.

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SciSpace's Advanced Structural and Chemical Imaging is currently available as an online tool. We're developing a desktop version, too. You can request (or upvote) any features that you think would be helpful for you and other researchers in the "feature request" section of your account once you've signed up with us.

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11. What is the output that I would get after using Advanced Structural and Chemical Imaging?

After writing your paper autoformatting in Advanced Structural and Chemical Imaging, you can download it in multiple formats, viz., PDF, Docx, and LaTeX.

12. Is Advanced Structural and Chemical Imaging's impact factor high enough that I should try publishing my article there?

To be honest, the answer is no. The impact factor is one of the many elements that determine the quality of a journal. Few of these factors include review board, rejection rates, frequency of inclusion in indexes, and Eigenfactor. You need to assess all these factors before you make your final call.

13. What is Sherpa RoMEO Archiving Policy for Advanced Structural and Chemical Imaging?

SHERPA/RoMEO Database

We extracted this data from Sherpa Romeo to help researchers understand the access level of this journal in accordance with the Sherpa Romeo Archiving Policy for Advanced Structural and Chemical Imaging. The table below indicates the level of access a journal has as per Sherpa Romeo's archiving policy.

RoMEO Colour Archiving policy
Green Can archive pre-print and post-print or publisher's version/PDF
Blue Can archive post-print (ie final draft post-refereeing) or publisher's version/PDF
Yellow Can archive pre-print (ie pre-refereeing)
White Archiving not formally supported
FYI:
  1. Pre-prints as being the version of the paper before peer review and
  2. Post-prints as being the version of the paper after peer-review, with revisions having been made.

14. What are the most common citation types In Advanced Structural and Chemical Imaging?

The 5 most common citation types in order of usage for Advanced Structural and Chemical Imaging are:.

S. No. Citation Style Type
1. Author Year
2. Numbered
3. Numbered (Superscripted)
4. Author Year (Cited Pages)
5. Footnote

15. How do I submit my article to the Advanced Structural and Chemical Imaging?

It is possible to find the Word template for any journal on Google. However, why use a template when you can write your entire manuscript on SciSpace , auto format it as per Advanced Structural and Chemical Imaging's guidelines and download the same in Word, PDF and LaTeX formats? Give us a try!.

16. Can I download Advanced Structural and Chemical Imaging in Endnote format?

Yes, SciSpace provides this functionality. After signing up, you would need to import your existing references from Word or Bib file to SciSpace. Then SciSpace would allow you to download your references in Advanced Structural and Chemical Imaging Endnote style according to Elsevier guidelines.

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I spent hours with MS word for reformatting. It was frustrating - plain and simple. With SciSpace, I can draft my manuscripts and once it is finished I can just submit. In case, I have to submit to another journal it is really just a button click instead of an afternoon of reformatting.

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