Example of Advanced Structural and Chemical Imaging format
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Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format Example of Advanced Structural and Chemical Imaging format
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open access Open Access e-ISSN: 21980926
recommended Recommended

Advanced Structural and Chemical Imaging — Template for authors

Publisher: Springer
Categories Rank Trend in last 3 yrs
Radiology, Nuclear Medicine and Imaging #10 of 288 down down by None rank
Spectroscopy #5 of 74 down down by None rank
Chemical Engineering (miscellaneous) #5 of 27 down down by None rank
journal-quality-icon Journal quality:
High
calendar-icon Last 4 years overview: 35 Published Papers | 325 Citations
indexed-in-icon Indexed in: Scopus
last-updated-icon Last updated: 05/07/2020
Insights & related journals
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FAQ

Journal Performance & Insights

  • CiteRatio
  • SJR
  • SNIP

CiteRatio is a measure of average citations received per peer-reviewed paper published in the journal.

9.3

63% from 2019

CiteRatio for Advanced Structural and Chemical Imaging from 2016 - 2020
Year Value
2020 9.3
2019 5.7
2018 0.8
graph view Graph view
table view Table view

insights Insights

  • CiteRatio of this journal has increased by 63% in last years.
  • This journal’s CiteRatio is in the top 10 percentile category.

SCImago Journal Rank (SJR) measures weighted citations received by the journal. Citation weighting depends on the categories and prestige of the citing journal.

2.628

90% from 2019

SJR for Advanced Structural and Chemical Imaging from 2019 - 2020
Year Value
2020 2.628
2019 1.385
graph view Graph view
table view Table view

insights Insights

  • SJR of this journal has increased by 90% in last years.
  • This journal’s SJR is in the top 10 percentile category.

Source Normalized Impact per Paper (SNIP) measures actual citations received relative to citations expected for the journal's category.

2.366

114% from 2019

SNIP for Advanced Structural and Chemical Imaging from 2018 - 2020
Year Value
2020 2.366
2019 1.107
2018 1.145
graph view Graph view
table view Table view

insights Insights

  • SNIP of this journal has increased by 114% in last years.
  • This journal’s SNIP is in the top 10 percentile category.

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CiteRatio: 6.0 | SJR: 1.278 | SNIP: 1.052
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CiteRatio: 5.5 | SJR: 1.72 | SNIP: 1.405

Advanced Structural and Chemical Imaging

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Springer

Advanced Structural and Chemical Imaging

Approved by publishing and review experts on SciSpace, this template is built as per for Advanced Structural and Chemical Imaging formatting guidelines as mentioned in Springer author instructions. The current version was created on and has been used by 713 authors to write and format their manuscripts to this journal.

Dynamic imaging

i
Last updated on
05 Jul 2020
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ISSN
1606-8610
i
Open Access
Yes
i
Sherpa RoMEO Archiving Policy
White faq
i
Plagiarism Check
Available via Turnitin
i
Endnote Style
Download Available
i
Citation Type
Author Year
(Blonder et al, 1982)
i
Bibliography Example
Beenakker CWJ (2006) Specular andreev reflection in graphene. Phys Rev Lett 97(6):067,007, URL 10.1103/PhysRevLett.97.067007

Top papers written in this journal

open accessOpen access Journal Article DOI: 10.1186/S40679-015-0008-4
Smart Align—a new tool for robust non-rigid registration of scanning microscope data

Abstract:

Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning t... Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal series for optical sectioning or aberration measurement, beam damage studies or camera-length series to study the effects of strain; whilst in the scanning tunnelling microscope, this might include bias-voltage series to probe local electronic structure. Whatever the application, such investigations must begin with the careful alignment of these data stacks, an operation that is not always trivial. In addition, the presence of low-frequency scanning distortions can introduce intra-image shifts to the data. Here, we describe an improved automated method of performing non-rigid registration customised for the challenges unique to scanned microscope data specifically addressing the issues of low-SNR data, images containing a large proportion of crystalline material and/or local features of interest such as dislocations or edges. Careful attention has been paid to artefact testing of the non-rigid registration method used, and the importance of this registration for the quantitative interpretation of feature intensities and positions is evaluated. read more read less

Topics:

Microscope (57%)57% related to the paper, Optical sectioning (56%)56% related to the paper, Image registration (53%)53% related to the paper
View PDF
245 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-017-0042-5
Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting.
Magnus Nord1, Per Erik Vullum1, Per Erik Vullum2, Ian MacLaren3, Thomas Tybell1, Randi Holmestad1

Abstract:

Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different... Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different elements. In this work, we present a free and open source software tool for analysing both the position and shapes of atomic columns in STEM-images, using 2-D elliptical Gaussian distributions. The software is tested on variants of the perovskite oxide structure. By first fitting the most intense atomic columns and then subtracting them, information on all the projected sublattices can be obtained. From this, we can extract changes in the lattice parameters and shape of A-cation columns from annular dark field images of perovskite oxide heterostructures. Using annular bright field images, shifts in oxygen column positions are also quantified in the same heterostructure. The precision of determining the position of atomic columns is compared between STEM data acquired using standard acquisition, and STEM-images obtained as an image stack averaged after using non-rigid registration. read more read less

Topics:

Dark field microscopy (51%)51% related to the paper
View PDF
97 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-017-0046-1
A fast image simulation algorithm for scanning transmission electron microscopy.
Colin Ophus1

Abstract:

Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave ... Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor f that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with f 4 compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate. read more read less

Topics:

Scanning confocal electron microscopy (63%)63% related to the paper, Electron tomography (59%)59% related to the paper, Energy filtered transmission electron microscopy (57%)57% related to the paper, Conventional transmission electron microscope (57%)57% related to the paper, Prism (57%)57% related to the paper
View PDF
92 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-015-0006-6
Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets.

Abstract:

The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, ... The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information. read more read less

Topics:

Data analysis (51%)51% related to the paper
View PDF
89 Citations
open accessOpen access Journal Article DOI: 10.1186/S40679-016-0036-8
SYRMEP Tomo Project: a graphical user interface for customizing CT reconstruction workflows.

Abstract:

When considering the acquisition of experimental synchrotron radiation (SR) X-ray CT data, the reconstruction workflow cannot be limited to the essential computational steps of flat fielding and filtered back projection (FBP). More refined image processing is often required, usually to compensate artifacts and enhance the qua... When considering the acquisition of experimental synchrotron radiation (SR) X-ray CT data, the reconstruction workflow cannot be limited to the essential computational steps of flat fielding and filtered back projection (FBP). More refined image processing is often required, usually to compensate artifacts and enhance the quality of the reconstructed images. In principle, it would be desirable to optimize the reconstruction workflow at the facility during the experiment (beamtime). However, several practical factors affect the image reconstruction part of the experiment and users are likely to conclude the beamtime with sub-optimal reconstructed images. Through an example of application, this article presents SYRMEP Tomo Project (STP), an open-source software tool conceived to let users design custom CT reconstruction workflows. STP has been designed for post-beamtime (off-line use) and for a new reconstruction of past archived data at user’s home institution where simple computing resources are available. Releases of the software can be downloaded at the Elettra Scientific Computing group GitHub repository https://github.com/ElettraSciComp/STP-Gui . read more read less

Topics:

Iterative reconstruction (54%)54% related to the paper
View PDF
70 Citations
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Frequently asked questions

Absolutely not! With our tool, you can freely write without having to focus on LaTeX. You can write your entire paper as per the Advanced Structural and Chemical Imaging guidelines and autoformat it.

Yes. The template is fully compliant as per the guidelines of this journal. Our experts at SciSpace ensure that. Also, if there's any update in the journal format guidelines, we take care of it and include that in our algorithm.

Sure. We support all the top citation styles like APA style, MLA style, Vancouver style, Harvard style, Chicago style, etc. For example, in case of this journal, when you write your paper and hit autoformat, it will automatically update your article as per the Advanced Structural and Chemical Imaging citation style.

You can avail our Free Trial for 7 days. I'm sure you'll find our features very helpful. Plus, it's quite inexpensive.

Yup. You can choose the right template, copy-paste the contents from the word doc and click on auto-format. You'll have a publish-ready paper that you can download at the end.

A matter of seconds. Besides that, our intuitive editor saves a load of your time in writing and formating your manuscript.

One little Google search can get you the Word template for any journal. However, why do you need a Word template when you can write your entire manuscript on SciSpace, autoformat it as per Advanced Structural and Chemical Imaging's guidelines and download the same in Word, PDF and LaTeX formats? Try us out!.

Absolutely! You can do it using our intuitive editor. It's very easy. If you need help, you can always contact our support team.

SciSpace is an online tool for now. We'll soon release a desktop version. You can also request (or upvote) any feature that you think might be helpful for you and the research community in the feature request section once you sign-up with us.

Sure. You can request any template and we'll have it up and running within a matter of 3 working days. You can find the request box in the Journal Gallery on the right sidebar under the heading, "Couldn't find the format you were looking for?".

After you have written and autoformatted your paper, you can download it in multiple formats, viz., PDF, Docx and LaTeX.

To be honest, the answer is NO. The impact factor is one of the many elements that determine the quality of a journal. Few of those factors the review board, rejection rates, frequency of inclusion in indexes, Eigenfactor, etc. You must assess all the factors and then take the final call.

SHERPA/RoMEO Database

We have extracted this data from Sherpa Romeo to help our researchers understand the access level of this journal. The following table indicates the level of access a journal has as per Sherpa Romeo Archiving Policy.

RoMEO Colour Archiving policy
Green Can archive pre-print and post-print or publisher's version/PDF
Blue Can archive post-print (ie final draft post-refereeing) or publisher's version/PDF
Yellow Can archive pre-print (ie pre-refereeing)
White Archiving not formally supported
FYI:
  1. Pre-prints as being the version of the paper before peer review and
  2. Post-prints as being the version of the paper after peer-review, with revisions having been made.

The 5 most common citation types in order of usage are:.

S. No. Citation Style Type
1. Author Year
2. Numbered
3. Numbered (Superscripted)
4. Author Year (Cited Pages)
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After uploading your paper on SciSpace, you would see a button to request a journal submission service for Advanced Structural and Chemical Imaging.

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Yes. SciSpace provides this functionality.

After signing up, you would need to import your existing references from Word or .bib file.

SciSpace would allow download of your references in Advanced Structural and Chemical Imaging Endnote style, according to springer guidelines.

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