Agilent Technologies

About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..

Engineering the spatial selectivity of surfaces at the nanoscale using particle lithography combined with vapor deposition of organosilanes.

Abstract: Particle lithography is a practical approach to generate millions of organosilane nanostructures on various surfaces, without the need for vacuum environments or expensive instrumentation. This report describes a stepwise chemistry route to prepare organosilane nanostructures and then apply the patterns as a spatially selective foundation to attach gold nanoparticles. Sites with thiol terminal groups were sufficiently small to localize the attachment of clusters of 2−5 nanoparticles. Basic steps such as centrifuging, drying, heating, and rinsing were used to generate arrays of regular nanopatterns. Close-packed films of monodisperse latex spheres can be used as an evaporative mask to spatially direct the placement of nanoscopic amounts of water on surfaces. Vapor phase organosilanes deposit selectively at areas of the surface containing water residues to generate nanostructures with regular thickness, geometry, and periodicity as revealed in atomic force microscopy images. The area of contact underneath t...

Transcriptional profiling of genes responsive to abscisic acid and gibberellin in rice: phenotyping and comparative analysis between rice and Arabidopsis.

Abstract: We collected and completely sequenced 32,127 full-length complementary DNA clones from Oryza sativa L. ssp. japonica cv. “Nipponbare.” Mapping of these clones to genomic DNA revealed ∼20,500 transc...

PCR microreactor for amplifying DNA using microquantities of sample fluid

Abstract: A microanalytical device is provided for conducting chemical processes using small amounts of fluid. The devices include microstructures, e.g., microcavities, microchannels and the like, that are laser ablated or otherwise formed in a support substrate, and can be used in a variety of chemical and biochemical methods, including chromatographic, electrophoretic and electrochromatographic separations, screening and diagnostics, and chemical and biochemical synthesis. The devices are formed from a material that is thermally and chemically stable and resistant to biofouling, significantly reducing electroosmotic flow and unwanted adsorption of solute. Preferred materials are polymeric.

Different delivery methods-different expression profiles.

Abstract: Recent publications by several groups of researchers have suggested that small interfering RNAs (siRNA) delivered by lipid-mediated transfection induce both sequence-specific effects1 and broad, class-specific changes in gene expression1, 2, 3, 4. These findings challenge convictions previously held in the RNA interference (RNAi) community that assert virtual sequence specificity of siRNA knockdown, and they bring into question the value of this methodology as a research and therapeutic tool.

Load-pull + NVNA = enhanced X-parameters for PA designs with high mismatch and technology-independent large-signal device models

Abstract: X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions This work presents an automated application combining a nonlinear vector network analyzer (NVNA) instrument with automated load-pull measurements that extends the measurement and extraction of X-parameters over the entire Smith Chart The augmented X-parameter data include magnitude and phase as nonlinear functions of power, bias, and load, at each harmonic generated by the device and measured by the NVNA The X-parameters can be immediately used in a nonlinear simulator for complex microwave circuit analysis and design This capability extends the applicability of measurement-based X-parameters to highly mismatched environments, such as high-power and multi-stage amplifiers, and power transistors designed to work far from 50 ohms It provides a powerful and general technology-independent alternative, with improved accuracy and speed, to traditional large-signal device models which are typically slow to develop and typically extrapolate large-signal operation from small-signal and DC measurements