Agilent Technologies

About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..

Array assay devices and methods of using the same

Abstract: Array assay devices and methods for using the same in array based assays are provided. The subject devices are characterized by having a base dimensioned to hold a substrate having at least one array, a cover dimensioned to cover the substrate and a snap-fit for holding the cover and the base together to enclose a space between the base and the cover. The subject invention also includes methods for performing an array assay. In the subject methods, a subject device is provided and a substrate having at least one array is positioned on the base. The snap-fit is engaged to hold the cover and the base together to enclose a space between the base and the cover. Next, a sample is contacted with the at least one array and an array assay is performed. The subject invention also includes kits which include the subject devices.

Partitioning of polymorphic DNAs

Abstract: Methods for applying graph theory techniques in methods to establish multiplexed assay formats for analyzing polymorphic DNAs are provided. These methods are used for designing and carrying out rapid and efficient processes for distinguishing target polymorphic DNA segments on the basis of variations in sequence and/or length. The methods are thus useful in the design of assays for determining identity, ancestry, predisposition to disease, or the presence or absence of a desired trait; genetic linkage analyses (gene mapping); and drug development.

Electronic planar laminography system and method

Abstract: An improved linear scan geometry laminography system that allows for generation of high speed and high resolution X-ray laminographs using an electronic detector operating in a time-domain integration mode coupled with a moving source of X-rays. In one embodiment, the improved scanning laminography system does not require any mechanical motion of the object being inspected, the X-ray source or detectors. Higher speed is achieved over conventional laminography systems due to the electronic nature of the scan. The same architecture also allows for both two-dimensional radiography and digital reconstruction techniques. Usage of the technique provides for higher throughput, higher resolution, and simpler designs than do currently available systems. An analysis of different system design parameters for the basic X-ray imaging architecture utilizing time-domain integration to generate cross-sectional images is included to facilitate specific design configurations. The relationships between resolution, speed, and cost are considered.