Agilent Technologies

About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..

Broad-band poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal vectorial network measurements

Abstract: We present an optimal experiment design methodology and a superior and fully automated model generation procedure for identifying a class of broad-band multiharmonic behavioral models in the frequency domain. The approach reduces the number of nonlinear measurements needed, minimizes the time to generate the data from simulations, reduces the time to extract the model functions from data, and when used for simulation-based models, takes maximum advantage of specialized simulation algorithms. The models have been subject to extensive validation in applications to real microwave integrated circuits. The derived model is valid for both small and large amplitude drive signals, correctly predicts even and odd harmonics through cascaded chains of functional blocks, simulates accurately load-pull behavior away from 50 /spl Omega/, and predicts adjacent channel power ratio and constellation diagrams in remarkably close agreement to the circuit model from which the behavioral model was derived. The model and excitation design templates for generating them from simulations are implemented in Agilent Technologies' Advanced Design System.

Critical issues in making small-depth mechanical property measurements by nanoindentation with continuous stiffness measurement

Abstract: Experiments were performed on a (100) copper single crystal to examine the influences that small displacement oscillations used in continuous stiffness measurement techniques have on hardness and elastic-modulus measurements in nanoindentation experiments. For the commonly used 2-nm oscillation, significant errors were observed in the measured properties, especially the hardness, at penetration depths as large as 100 nm. The errors originate from the large amount of dynamic unloading that occurs in materials like copper that have high contact stiffness resulting from their high modulus-to-hardness ratios. A simple model for the loading and unloading behavior of an elastic–plastic material is presented that quantitatively describes the errors and can be used to partially correct for them. By correcting the data in accordance with model and performing measurements at smaller displacement oscillation amplitudes, the errors can be reduced. The observations have important implications for the interpretation of the indentation size effect.

Atmospheric Pressure Photoionization. 1. General Properties for LC/MS

Abstract: In this work, we describe the performance of an atmospheric pressure photoionization (APPI) source for sampling liquid flows. The results presented here primarily focus on the mechanism of direct photoionization (PI), as compared to the dopant mechanism of PI. Measured detection limits for direct APPI were comparable to atmospheric pressure chemical ionization (APCI; e.g., 1 pg for reserpine). The ion signal is linear up to 10 ng injected quantity, with a useful dynamic range exceeding 100 ng. Evidence is presented indicating that APPI achieves significantly better sensitivity than APCI at flow rates below 200 μL/min, making it a useful source for capillary liquid chromatography and capillary electrophoresis. Results are presented indicating that APPI is less susceptible to ion suppression and salt buffer effects than APCI and electrospray ionization (ESI). The principal benefit of APPI, as compared to other ionization sources, is in efficiently ionizing broad classes of nonpolar compounds. Thus, APPI is ...

Indicator components for microfluidic systems

Abstract: Microfluidic devices and systems that include keying, registration or indication elements that communicate a functionality of the microfluidic device to the instrumentation which is used in conjunction with these devices. Indicator elements include structural indicators, electrical indicators, optical indicators and chemical indicators. Different indicator elements are indicative of different functionalities, e.g., applications, new vs. used, and the like.