Agilent Technologies

About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..

MU-MIMO in LTE Systems

Abstract: A relatively recent idea of extending the benefits of MIMO systems to multiuser scenarios seems promising in the context of achieving high data rates envisioned for future cellular standards after 3G (3rd Generation). Although substantial research has been done on the theoretical front, recent focus is on making Multiuser Multiple-Input Multiple-Output (MUMIMO) practically realizable. This paper presents an overview of the different MU-MIMO schemes included/being studied in 3GPP standardization from LTE (long-term evolution) to LTE Advanced. MU-MIMO system concepts and implementation aspects have been studied here. Various low-complexity receiver architectures are investigated, and their performance assessed through link-level simulations. Appealing performance offered by low-complexity interference aware (IA) receivers is notably emphasized. Furthermore, system level simulations for LTE Release 8 are provided. Interestingly, it is shown that MU-MIMO only offers marginal performance gains with respect to single-user MIMO. This arises from the limited MU-MIMO features included in Release 8 and calls for improved schemes for the upcoming releases.

Identification of endothelial cell genes by combined database mining and microarray analysis.

Abstract: Vascular endothelial cells maintain the interface between the systemic circulation and soft tissues and mediate critical processes such as inflammation in a vascular bed-selective fashion. To expan...

System and method for using mobile collectors for accessing a wireless sensor network

Abstract: A system and method are provided that use mobile collectors for accessing a wireless sensor network. In certain embodiments, one or more mobile collectors having mobility that is unpredictable to a wireless sensor network are deployed for use in accessing the wireless sensor network. Thus, rather than relying on an access technique having certainty designed therein with regard to the access of a wireless sensor network, certain embodiments utilize an access technique that relies on statistical probability for accessing the wireless sensor network. For instance, by deploying a plurality of mobile collectors that are operable for accessing a wireless sensor network, a statistical probability exists that at some point (or at various points in time) at least one of the mobile collectors will travel within range of the wireless sensor network to enable access thereof.

Loaded-board, guided-probe test fixture

Abstract: A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).