Institution
Agilent Technologies
Company•Santa Clara, California, United States•
About: Agilent Technologies is a company organization based out in Santa Clara, California, United States. It is known for research contribution in the topics: Signal & Mass spectrometry. The organization has 7398 authors who have published 11518 publications receiving 262410 citations. The organization is also known as: Agilent Technologies, Inc..
Papers published on a yearly basis
Papers
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TL;DR: This investigation into the use of ultrafast chiral chromatography as a second dimension for 2D chromatographic separations of chiral and achiral drugs and metabolites, constitutional isomers, stereoisomers, and organohalogenated species is reported.
Abstract: Chromatographic separation and analysis of complex mixtures of closely related species is one of the most challenging tasks in modern pharmaceutical analysis. In recent years, two-dimensional liquid chromatography (2D-LC) has become a valuable tool for improving peak capacity and selectivity. However, the relatively slow speed of chiral separations has limited the use of chiral stationary phases (CSPs) as the second dimension in 2D-LC, especially in the comprehensive mode. Realizing that the recent revolution in the field of ultrafast enantioselective chromatography could now provide significantly faster separations, we herein report an investigation into the use of ultrafast chiral chromatography as a second dimension for 2D chromatographic separations. In this study, excellent selectivity, peak shape, and repeatability were achieved by combining achiral and chiral narrow-bore columns (2.1 mm × 100 mm and 2.1 mm × 150 mm, sub-2 and 3 μm) in the first dimension with 4.6 mm × 30 mm and 4.6 mm × 50 mm colum...
96 citations
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30 Jan 2003TL;DR: In this paper, the authors present tools and systems for displaying network diagrams to convey both focus and context to a user of the display, by presenting items of interest in sharp definition and the remainder of a diagram or diagrams being blurred or having relative degrees of sharpness/blurriness.
Abstract: Visualization techniques tools and systems for displaying network diagrams to convey both focus and context to a user of the display. Network diagrams may be displayed to emulate a three dimensional presentation. Network diagrams may be presented with items of interest in sharp definition and the remainder of a diagram or diagrams being blurred or having relative degrees of sharpness/blurriness.
95 citations
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TL;DR: In this article, the guiding, bending, and splitting of electromagnetic (EM) waves in highly confined waveguides built around three-dimensional layer-by-layer photonic crystals by removing a single rod was demonstrated.
Abstract: We have experimentally demonstrated the guiding, bending, and splitting of electromagnetic (EM) waves in highly confined waveguides built around three-dimensional layer-by-layer photonic crystals by removing a single rod. Full transmission of the EM waves was observed for straight and bended waveguides. We also investigated the power splitter structures in which the input EM power could be efficiently divided into the output waveguide ports. The experimental results, dispersion relation and photon lifetime, were analyzed with a theory based on the tight-binding photon picture. Our results provide an important tool for designing photonic crystal based optoelectronic components.
95 citations
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TL;DR: This presentation describes some atypical types of silica-based particles with unique separation properties that enlarge the capabilities of HPLC methods.
95 citations
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07 Oct 2002TL;DR: The problems of per-test diagnosis are addressed by improving the candidate matching, introducing scoring and ranking techniques, and by developing a method to translate the results into common defect scenarios.
Abstract: The advantage to "one test at a time" fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacity of the diagnostic answer. In this paper, we address the problems of per-test diagnosis by improving the candidate matching, introducing scoring and ranking techniques, and by developing a method to translate the results into common defect scenarios. Our experimental results on simulated defects indicate that not only are the results improved on complex behaviors, but by considering passing test results we improve a common case where per-test algorithms can perform significantly worse than traditional diagnosis algorithms. Finally, our method of candidate analysis provides a way to bridge the per-test approach with traditional model-based fault diagnosis.
95 citations
Authors
Showing all 7402 results
Name | H-index | Papers | Citations |
---|---|---|---|
Hongjie Dai | 197 | 570 | 182579 |
Zhuang Liu | 149 | 535 | 87662 |
Jie Liu | 131 | 1531 | 68891 |
Thomas Quertermous | 103 | 405 | 52437 |
John E. Bowers | 102 | 1767 | 49290 |
Roy G. Gordon | 89 | 449 | 31058 |
Masaru Tomita | 76 | 677 | 40415 |
Stuart Lindsay | 74 | 347 | 22224 |
Ron Shamir | 74 | 319 | 23670 |
W. Richard McCombie | 71 | 144 | 64155 |
Tomoyoshi Soga | 71 | 392 | 21209 |
Michael R. Krames | 65 | 321 | 18448 |
Shabaz Mohammed | 64 | 188 | 17254 |
Geert Leus | 62 | 609 | 19492 |
Giuseppe Gigli | 61 | 541 | 15159 |