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Institution

Alcatel-Lucent

Stuttgart, Germany
About: Alcatel-Lucent is a based out in Stuttgart, Germany. It is known for research contribution in the topics: Signal & Network packet. The organization has 37003 authors who have published 53332 publications receiving 1430547 citations. The organization is also known as: Alcatel-Lucent S.A. & Alcatel.


Papers
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Journal ArticleDOI
20 Nov 1998-Science
TL;DR: Strong and sustained electron emission at low electric fields was observed in undoped, nanostructured diamond, which are the lowest fields ever reported for any field-emitting material at technologically useful current densities.
Abstract: Strong and sustained electron emission at low electric fields was observed in undoped, nanostructured diamond. Electron emission of 10 milliamperes per square centimeter was observed at applied fields of 3 to 5 volts per micrometer. These are the lowest fields ever reported for any field-emitting material at technologically useful current densities. The emitter consists of a layer of nanometer-size diamond particulates, which is heat-treated in a hydrogen plasma. These emission characteristics are attributed to the particles' high defect density and the low electron affinity of the diamond surface. Such emitters are technologically useful, because they can be easily and economically fabricated on large substrates.

398 citations

Journal ArticleDOI
TL;DR: The Occupational Information Network (O*NET) as discussed by the authors is a taxonomic approach to occupational descriptors, which is used to describe jobs and their characteristics. But the O*NET does not provide a taxonomy of occupational attributes.
Abstract: The Occupational Information Network (O*NET) has recently been developed as a replacement for the Dictionary of Occupational Titles. As a comprehensive system designed to describe occupations, the O*NET incorporates the last 60 years of knowledge about the nature of jobs and work. This article summarizes its development and validation by first discussing how the O*NET used multiple descriptors to provide “multiple windows” on the world of work, utilized cross-job descriptors to provide a common language to describe different jobs, and used a hierarchical taxonomic approach to occupational descriptors. Second, we provide an overview of the O*NET's Content Model of descriptor domains (i.e., worker characteristics, worker requirements, occupational requirements, experience requirements, occupation characteristics, and occupation-specific requirements) and their potential uses. Third, we discuss some of the technical issues surrounding the O*NET Finally, we discuss some of the implications for research and theory, as well as some limitations of the O*NET system.

398 citations

Journal ArticleDOI
01 Mar 1998-Nature
TL;DR: In this article, a composition spread technique was used to evaluate thin-film dielectrics with high dielectric constant and high breakdown field for the Zr 0.15Sn0.3Ti0.55O2−δ system.
Abstract: The continuing drive towards miniaturization of electronic devices1 is motivating the search for new materials. Consider, for example, the case of the much-used dynamic random-access memory. The minimum capacitance per cell that can be tolerated is expected2 to remain at 30–40 fF, but as the cell area decreases, the corresponding reduction in geometric capacitance has to be compensated for. So far, this has been achieved by resorting to complex non-planar structures and/or using much thinner films of the dielectric insulator, amorphous silicon dioxide (a-SiOx), although the latter approach is limited by the electric fields that can be supported by a-SiOx before its insulating properties break down. An alternative strategy is to develop thin-film insulators that have a dielectric constant significantly greater than that of a-SiOx, reducing the size of the fields required for device operation. Here we show that a composition-spread technique allows for the efficient evaluating of materials with both a high dielectric constant and a high breakdown field. We apply this approach to the Zr–Sn–Ti–O system, and we find that compositions close to Zr0.15Sn0.3Ti0.55O2−δ are better thin-film dielectrics than high-quality deposited a-SiOx. Although detailed tests of the performance of these materials have not yet been carried out, our initial results suggest that they are likely to be comparable to the best alternatives (such as (Ba, Sr)TiO3) currently being considered for integrated-circuit capacitors.

396 citations

Journal ArticleDOI
TL;DR: In this paper, the authors measured the filling factor, correlation function, and power spectrum of transmitted flux in a large sample of Lyα forest spectra, comprised of 30 Keck HIRES spectra and 23 Keck LRIS spectra.
Abstract: We measure the filling factor, correlation function, and power spectrum of transmitted flux in a large sample of Lyα forest spectra, comprised of 30 Keck HIRES spectra and 23 Keck LRIS spectra. We infer the linear matter power spectrum P(k) from the flux power spectrum PF(k), using an improved version of the method of Croft et al. that accounts for the influence of redshift-space distortions, nonlinearity, and thermal broadening on the shape of PF(k). The evolution of the shape and amplitude of P(k) over the redshift range of the sample (z ≈ 2-4) is consistent with the predictions of gravitational instability, implying that nongravitational fluctuations do not make a large contribution to structure in the Lyα forest. Our fiducial measurement of P(k) comes from a subset of the data with 2.3 < z < 2.9, mean absorption redshift z = 2.72, and total path length Δz ≈ 25. It has a dimensionless amplitude Δ2(kp) = 0.74 at wavenumber kp = 0.03 (km s-1)-1 and is well described by a power law of index ν = -2.43 ± 0.06 or by a CDM-like power spectrum with shape parameter Γ' = 1.3 × 10-3 (km s-1)-1 at z = 2.72 (all error bars 1 σ). The correspondence to present-day P(k) parameters depends on the adopted cosmology. For Ωm = 0.4, ΩΛ = 0.6, the best-fit shape parameter is Γ = 0.16 h Mpc-1, in good agreement with measurements from the 2dF Galaxy Redshift Survey, and the best-fit normalization is σ8 = 0.82(Γ/0.15)-0.44. Matching the observed cluster mass function and our measured Δ2(kp) in spatially flat cosmological models requires Ωm = 0.38 + 2.2(Γ - 0.15). Matching Δ2(kp) in COBE-normalized, flat CDM models with no tensor fluctuations requires Ωm = (0.29 ± 0.04)n-2.89 h, and models that satisfy this constraint are also consistent with our measured logarithmic slope. The Lyα forest complements other observational probes of the linear matter power spectrum by constraining a regime of redshift and length scale not accessible by other means, and the consistency of these inferred parameters with independent estimates provides further support for a cosmological model based on inflation, cold dark matter, and vacuum energy.

395 citations

Proceedings ArticleDOI
21 May 1999
TL;DR: The PuLSETM (Product Line Software Engineering) methodology is developed for the purpose of enabling the conception and deployment of software product lines within a large variety of enterprise contexts and captures and leverages the results from the technology transfer activities with industrial customers.
Abstract: Software product lines have recently been introduced as one of the most promising advances for efficient software development. Yet upon close examination, there are few guidelines or methodologies available to develop and deploy product lines beyond existing domain engineering approaches. The latter have had mixed success within commercial enterprises because of their deployment complexity, lack of customizability, and especially their misplaced focus, that is on domains as opposed to products. To tackle these problems we developed the PuLSETM (Product Line Software Engineering) methodology for the purpose of enabling the conception and deployment of software product lines within a large variety of enterprise contexts. This is achieved via product-centric focus throughout the phases of PuLSETM, customizability of its components, incremental introduction capability, maturity scale for structured evolution, and adaptations to a few main product development situations. PuLSETM is the result of a bottom-up effort: the methodology captures and leverages the results (the lessons learned) from our technology transfer activities with our industrial customers. We present in this paper the main ideas behind PuLSETM and illustrate the methodology with a running example taken from our transfer experience.

395 citations


Authors

Showing all 37011 results

NameH-indexPapersCitations
George M. Whitesides2401739269833
Yoshua Bengio2021033420313
John A. Rogers1771341127390
Zhenan Bao169865106571
Thomas S. Huang1461299101564
Federico Capasso134118976957
Robert S. Brown130124365822
Christos Faloutsos12778977746
Robert J. Cava125104271819
Ramamoorthy Ramesh12264967418
Yann LeCun121369171211
Kamil Ugurbil12053659053
Don Towsley11988356671
Steven P. DenBaars118136660343
Robert E. Tarjan11440067305
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20231
202212
202130
202050
201983
2018215