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Showing papers by "fondazione bruno kessler published in 2003"

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Journal Article•DOI•

TXRF Analysis of Low Z Elements and TXRF-NEXAFS Speciation of Organic Contaminants on Silicon Wafer Surfaces Excited by Monochromatized Undulator Radiation

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Burkhard Beckhoff¹, R. Fliegauf¹, Gerhard Ulm¹, Jan Weser¹, Giancarlo Pepponi², Christina Streli, Peter Wobrauschek, T. Ehmann, Laszlo Fabry, S. Pahlke, Birgit Kanngießer, Wolfgang Malzer - Show less +8 more•Institutions (2)

German National Metrology Institute¹, fondazione bruno kessler²

01 May 2003-Solid State Phenomena

5 citations