Harbin Institute of Technology

About: Harbin Institute of Technology is a education organization based out in Harbin, China. It is known for research contribution in the topics: Microstructure & Control theory. The organization has 88259 authors who have published 109297 publications receiving 1603393 citations. The organization is also known as: HIT.

Dye-sensitized lanthanide-doped upconversion nanoparticles

Abstract: Lanthanide-doped upconversion nanoparticles (UCNPs) are promising for applications as wide as biological imaging, multimodal imaging, photodynamic therapy, volumetric displays, and solar cells. Yet, the weak and narrow absorption of lanthanide ions poses a fundamental limit of UCNPs to withhold their brightness, creating a long-standing hurdle for the field. Dye-sensitized UCNPs are emerging to address this performance-limiting problem, yielding up to thousands-fold brighter luminescence than conventional UCNPs without dye sensitization. In their configuration, organic dyes with spectrally broad and intense absorption are anchored to the surface of UCNPs to harvest the excitation light energy, which is then transferred via Forster and/or Dexter mechanisms across the organic/inorganic interface to the lanthanides incorporated in UCNPs (with or devoid of a shell) to empower efficient upconversion. This tutorial review highlights recent progress in the development of dye sensitized UCNPs, with an emphasis on the theory of energy transfer, the geometric classification of the dye sensitized core and core/shell nanocrystals, and their emerging photonic and biophotonic applications. Opportunities and challenges offered by dye sensitized UCNPs are also discussed.

Fault Diagnosis and Tolerant Control of Single IGBT Open-Circuit Failure in Modular Multilevel Converters

Abstract: The modular multilevel converter (MMC) is distinguished by its modularity that is the use of standardized submodules (SMs). To enhance reliability and avoid unscheduled maintenance, it is desired that an MMC can remain operational without having to shut down despite some of its SMs are failed. Particularly, in this paper, complete fault diagnosis and tolerant control solution, including the fault detection, fault tolerance, fault localization, and fault reconfiguration, have been proposed to ride through the insulated gate bipolar transistor open-circuit failures. The fault detection method detects the fault by means of state observers and the knowledge of fault behaviors of MMC, without using any additional sensors. Then, the MMC is controlled in a newly proposed tolerant mode until the specific faulty SM is located by the fault localization method; thus, no overcurrent problems will happen during this time interval. After that, the located faulty SM will be bypassed while the remaining SMs are reconfigured to provide continuous operation. Throughout the fault periods, it allows the MMC to operate smoothly without obvious waveform distortion and power interruption. Finally, experimental results using a single-phase scaled-down MMC prototype with six SMs per arm show the validity and feasibility of the proposed methods.