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TL;DR: In this article, a great deal of interest has been focused on Adomian's Decomposition Method (ADM) and its applications to a wide class of physical problems containing fractional derivatives (Rida and Sherbiny, 2008; Saha Ray et al., 2008; Datta, 2007; Kaya, 2006; Jiang, 2005; Sutradhar, 2009).
Abstract: Recently, a great deal of interest has been focused on Adomian’s Decomposition Method (ADM) and its applications to a wide class of physical problems containing fractional derivatives (Rida and Sherbiny, 2008; Saha Ray et al., 2008; Datta, 2007; Kaya, 2006; Jiang, 2005; Sutradhar, 2009). The decomposition method employed here is adequately discussed in the published literature (Wazwaz, 2002; Adomian, 1994; Ngarhasta et al. 2002), but it still deserves emphasis to point out the very significant advantages over other methods. The said method can also be an effective procedure for the solution of the time fractional Fokker-Planck equation by suitable choice of drift and fluctuation term. The fractional differential equations have been used to model many physical and engineering processes such as frequency dependent damping behaviour of materials, motion of a large thin plate in a Newtonian fluid, creep and relaxation function for viscoelastic materials, etc. (Suarez and Shokooh, 1997; Glockle and Nonnenmacher, 1991). Moreover, phenomena in electromagnetics, acoustics, viscoplasticity, electrochemistry are also described by differential equations of fractional order (Podlubny, 1999; Shawagfeh, 2002).
2 citations
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30 Jul 2021
2 citations
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01 Sep 2016TL;DR: A new technique for test-time reduction in post-bond core-based 3D-SOCs, considering certain constraints on test power and TAM width (i.e., bounds on TSVs).
Abstract: While 3D chips open up versatile potentialities in compact system design, they pose the challenge of testing the composite system, which consists of multiple cores, logic, and memory, interconnected across different layers of the chip. The test strategy for such chips must also take into account the issues of inherent power and thermal constraints, design of test-access mechanism (TAM), and the decision concerning pre-bond and post-bond test choices. Additionally, for post-bond testing, the constraints imposed by the limited use of TSVs, worsen the controllability and observability of the cores that are accessed through the inter-layer scan-paths. Thus, while designing the TAM architecture, the optimization of overall test time under the constraints of power and TSV-count, is needed. This paper presents a new technique for test-time reduction in post-bond core-based 3D-SOCs, considering certain constraints on test power and TAM width (i.e., bounds on TSVs). The proposed algorithm runs much faster compared to prior art, and our results on several ITC02 benchmarks reveal significant reduction in test-time for most of the cases.
2 citations
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01 Dec 2019TL;DR: In this paper, an 8×8 narrow wall planar slotted array antenna by using differential feed with enhanced gain and reduced cross polarization radiation at X band has been proposed, where a H-plane tee is designed to feed the narrow wall PLANAR slotted waveguide array by using series-shunt rectangular couplers.
Abstract: A 8×8 narrow wall planar slotted array antenna by using differential feed with enhanced gain and reduced cross polarization radiation at X band has been proposed. A H-plane tee is designed to feed the narrow wall planar slotted waveguide array by using series-shunt rectangular couplers. Metallic flares are added to narrow wall of each waveguides to reduce the cross polarization level. The simulated gain is 23.3dB and 26.9dB without the differential feed and with the differential feed respectively, at 10GHz frequency.
2 citations
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07 Jun 2019TL;DR: This work aims to automate the potential threat detection process as much as possible using text mining techniques such as multiclass classification and information extraction to predict both hazardous elements and accidents while not considering any fixed number of classes.
Abstract: Analysis of industrial incident reports may aid in identifying potential danger and means to avoid them. We aim to automate the potential threat detection process as much as possible using text mining techniques such as multiclass classification and information extraction. While most of the related works concentrate mostly on either the cause of the incident or its effect and consider only a limited number of possible categories, we aim to predict both hazardous elements and accidents while not considering any fixed number of classes. Further, we also predict the potential target and the potential threat the incident poses.
2 citations
Authors
Showing all 581 results
Name | H-index | Papers | Citations |
---|---|---|---|
Debnath Bhattacharyya | 39 | 578 | 6867 |
Samiran Mitra | 38 | 198 | 5108 |
Dipankar Chakravorty | 35 | 369 | 5288 |
S. Saha Ray | 34 | 217 | 3888 |
Tai-hoon Kim | 33 | 526 | 4974 |
Anindya Sen | 29 | 109 | 3472 |
Ujjal Debnath | 29 | 335 | 3828 |
Anirban Mukhopadhyay | 29 | 169 | 3200 |
Avijit Ghosh | 28 | 121 | 2639 |
Mrinal K. Ghosh | 26 | 64 | 2243 |
Biswanath Bhunia | 23 | 75 | 1466 |
Jayati Datta | 23 | 55 | 1520 |
Nabarun Bhattacharyya | 23 | 136 | 1960 |
Pinaki Bhattacharya | 19 | 114 | 1193 |
Dwaipayan Sen | 18 | 71 | 1086 |